Year |
Citation |
Score |
2023 |
Ewing JJ, Lynsky C, Wong MS, Wu F, Chow YC, Shapturenka P, Iza M, Nakamura S, Denbaars SP, Speck JS. High external quantum efficiency (6.5%) InGaN V-defect LEDs at 600 nm on patterned sapphire substrates. Optics Express. 31: 41351-41360. PMID 38087536 DOI: 10.1364/OE.503732 |
0.396 |
|
2020 |
Khoury M, Li H, Bonef B, Mates T, Wu F, Li P, Wong MS, Zhang H, Song J, Choi J, Speck JS, Nakamura S, DenBaars SP. 560 nm InGaN micro-LEDs on low-defect-density and scalable (20-21) semipolar GaN on patterned sapphire substrates. Optics Express. 28: 18150-18159. PMID 32680016 DOI: 10.1364/Oe.387561 |
0.457 |
|
2019 |
Khoury M, Li H, Zhang H, Bonef B, Wong M, Wu F, Cohen D, De Mierry P, Vennéguès P, Speck JS, Nakamura S, DenBaars SP. Demonstration of Electrically Injected Semipolar Laser Diode Grown on Low Cost and Scalable Sapphire Substrates. Acs Applied Materials & Interfaces. PMID 31769651 DOI: 10.1021/Acsami.9B17525 |
0.38 |
|
2019 |
Saifaddin BK, Iza M, Foronda H, Almogbel A, Zollner CJ, Wu F, Alyamani A, Albadri A, Nakamura S, DenBaars SP, Speck JS. Impact of roughening density on the light extraction efficiency of thin-film flip-chip ultraviolet LEDs grown on SiC. Optics Express. 27: A1074-A1083. PMID 31510492 DOI: 10.1364/Oe.27.0A1074 |
0.437 |
|
2019 |
Kamikawa T, Gandrothula S, Araki M, Li H, Oliva VB, Wu F, Cohen D, Speck JS, Denbaars SP, Nakamura S. Realization of thin-film m-plane InGaN laser diode fabricated by epitaxial lateral overgrowth and mechanical separation from a reusable growth substrate. Optics Express. 27: 24717-24723. PMID 31510356 DOI: 10.1364/Oe.27.024717 |
0.406 |
|
2018 |
Alhassan AI, Young NG, Farrell RM, Pynn C, Wu F, Alyamani AY, Nakamura S, DenBaars SP, Speck JS. Development of high performance green c-plane III-nitride light-emitting diodes. Optics Express. 26: 5591-5601. PMID 29529761 DOI: 10.1364/Oe.26.005591 |
0.415 |
|
2016 |
Alhassan AI, Farrell RM, Saifaddin B, Mughal A, Wu F, DenBaars SP, Nakamura S, Speck JS. High luminous efficacy green light-emitting diodes with AlGaN cap layer. Optics Express. 24: 17868-17873. PMID 27505754 DOI: 10.1364/Oe.24.017868 |
0.392 |
|
2007 |
Hashimoto T, Wu F, Speck JS, Nakamura S. A GaN bulk crystal with improved structural quality grown by the ammonothermal method. Nature Materials. 6: 568-71. PMID 17603489 DOI: 10.1038/Nmat1955 |
0.447 |
|
2003 |
Golan Y, Fini P, Dahan D, Wu F, Zamir S, Salzman J, Speck JS. High-quality GaN on intentionally roughened c-sapphire Epj Applied Physics. 22: 11-14. DOI: 10.1051/Epjap:2003012 |
0.633 |
|
2003 |
Wu F, Zamir S, Meyler B, Salzman J, Golan Y. Microstructure of GaN grown by lateral confined epitaxy 2. GaN on patterned sapphire Journal of Electronic Materials. 32: 23-28. DOI: 10.1007/S11664-003-0248-2 |
0.621 |
|
2002 |
Zamir S, Meyler B, Salzman J, Wu F, Golan Y. Enhanced photoluminescence from GaN grown by lateral confined epitaxy Journal of Applied Physics. 91: 1191-1197. DOI: 10.1063/1.1432115 |
0.577 |
|
2002 |
Wu F, Zamir S, Meyler B, Salzman J, Golan Y. Microstructure of GaN deposited by lateral confined epitaxy on patterned Si (111) Journal of Electronic Materials. 31: 88-93. DOI: 10.1007/S11664-002-0178-4 |
0.616 |
|
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