Michael J. Duggin
Affiliations: | SUNY College of Environmental Science and Forestry, Syracuse, NY, United States |
Area:
Environmental Engineering, Environmental Sciences, Mathematics, Remote SensingGoogle:
"Michael Duggin"Cross-listing: MathTree
Children
Sign in to add trainee| James N. Sweet | grad student | 2003 | SUNY ESF |
| Darryl G. Murdock | grad student | 2004 | SUNY ESF |
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Publications
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| Duggin MJ, Egan WG, Gregory J. (1999) Measurements of polarization of targets of differing albedo and shadow depth Proceedings of Spie - the International Society For Optical Engineering. 3699: 27-37 |
| Duggin MJ, Kinn GJ, Muller JK, et al. (1999) Effect of altitude, view angle and sun angle, view angle correction procedures and the atmosphere on deduced vegetative indices Proceedings of Spie - the International Society For Optical Engineering. 3751: 102-112 |
| Kinn GJ, Duggin MJ. (1999) Effects of altitude, geometry, camera characteristics and atmosphere on digital image data Proceedings of Spie - the International Society For Optical Engineering. 3751: 92-101 |
| Philipson WR, Gordon DK, Philpot WD, et al. (1989) Technical note: Field reflectance calibration with grey standard reflectors International Journal of Remote Sensing. 10: 1035-1039 |
| Duggin MJ. (1987) Impact of radiance variations on satellite sensor calibration. Applied Optics. 26: 1264-71 |
| Duggin MJ. (1985) Comments on the intercalibration of multisensor, multitemporal, multichannel digital radiance data. Applied Optics. 24: 2292-4 |
| Duggin MJ, Philipson WR. (1985) Relating ground, aircraft and satellite radiance measurements: Spectral and spatial considerations International Journal of Remote Sensing. 6: 1665-1670 |
| Duggin MJ, Sakhavat H. (1985) Systematic and random variations in digital Thematic Mapper data |
| Duggin MJ, Piwinski D. (1984) Recorded radiance indices for vegetation monitoring using NOAA AVHRR data; atmospheric and other effects in multitemporal data sets. Applied Optics. 23: 2620 |
| Duggin MJ, Cunia T. (1983) Ground reflectance measurement techniques: a comparison. Applied Optics. 22: 3771-7 |