| Year |
Citation |
Score |
| 2020 |
Lopatin S, Aljarb A, Roddatis V, Meyer T, Wan Y, Fu JH, Hedhili M, Han Y, Li LJ, Tung V. Aberration-corrected STEM imaging of 2D materials: Artifacts and practical applications of threefold astigmatism. Science Advances. 6. PMID 32917685 DOI: 10.1126/Sciadv.Abb8431 |
0.366 |
|
| 2020 |
Aljarb A, Fu JH, Hsu CC, Chuu CP, Wan Y, Hakami M, Naphade DR, Yengel E, Lee CJ, Brems S, Chen TA, Li MY, Bae SH, Hsu WT, Cao Z, ... ... Lopatin S, et al. Ledge-directed epitaxy of continuously self-aligned single-crystalline nanoribbons of transition metal dichalcogenides. Nature Materials. PMID 32895505 DOI: 10.1038/S41563-020-0795-4 |
0.333 |
|
| 2020 |
Almalawi D, Lopatin S, Mitra S, Flemban TH, Siladie AM, Gayral B, Daudin B, Roqan IS. Enhanced UV emission of GaN nanowires functionalized by wider bandgap solution-processed p-MnO quantum dots. Acs Applied Materials & Interfaces. PMID 32623885 DOI: 10.1021/Acsami.0C07029 |
0.333 |
|
| 2020 |
Zhu YP, El-Demellawi JK, Yin J, Lopatin S, Lei Y, Liu Z, Miao X, Mohammed OF, Alshareef HN. Unprecedented Surface Plasmon Modes in Monoclinic MoO Nanostructures. Advanced Materials (Deerfield Beach, Fla.). e1908392. PMID 32201985 DOI: 10.1002/Adma.201908392 |
0.339 |
|
| 2019 |
Alwadai N, Ajia IA, Janjua B, Flemban TH, Mitra S, Wehbe N, Wei N, Lopatin S, Ooi BS, Roqan IS. Catalyst-Free Vertical ZnO-Nanotube Array Grown on p-GaN for UV-Light-Emitting Devices. Acs Applied Materials & Interfaces. PMID 31343859 DOI: 10.1021/Acsami.9B06195 |
0.348 |
|
| 2019 |
Velusamy DB, El-Demellawi JK, El-Zohry AM, Giugni A, Lopatin S, Hedhili MN, Mansour AE, Fabrizio ED, Mohammed OF, Alshareef HN. MXenes for Plasmonic Photodetection. Advanced Materials (Deerfield Beach, Fla.). e1807658. PMID 31222823 DOI: 10.1002/Adma.201807658 |
0.324 |
|
| 2019 |
Meyer T, Lopatin S, Seibt M, Roddatis V. A posteriori synchronization of scanning transmission electron microscopy signals with kilopixel per second acquisition rates. Ultramicroscopy. 200: 62-66. PMID 30826621 DOI: 10.1016/J.Ultramic.2019.02.020 |
0.305 |
|
| 2018 |
Chu Z, Han A, Lei C, Lopatin S, Li P, Wannlund D, Wu D, Herrera K, Zhang X, MacDonald AH, Li X, Li LJ, Lai K. Energy-resolved Photoconductivity Mapping in a Monolayer-bilayer WSe Lateral Heterostructure. Nano Letters. PMID 30289264 DOI: 10.1021/Acs.Nanolett.8B03318 |
0.365 |
|
| 2018 |
Neophytou M, Bryant D, Lopatin S, Chen H, Hallani RK, Cater L, McCulloch I, Yue W. Alternative Thieno[3,2-b][1]benzothiophene Isoindigo Polymers for Solar Cell Applications. Macromolecular Rapid Communications. PMID 29504170 DOI: 10.1002/Marc.201700820 |
0.317 |
|
| 2018 |
Liang R, Babics M, Seitkhan A, Wang K, Geraghty PB, Lopatin S, Cruciani F, Firdaus Y, Caporuscio M, Jones DJ, Beaujuge PM. Additive‐Morphology Interplay and Loss Channels in “All‐Small‐Molecule” Bulk‐heterojunction (BHJ) Solar Cells with the Nonfullerene Acceptor IDTTBM Advanced Functional Materials. 28: 1705464. DOI: 10.1002/Adfm.201705464 |
0.318 |
|
| 2017 |
Muhammed M, Alwadai N, Lopatin S, Kuramata A, Roqan IS. High-Efficiency InGaN/GaN Quantum Well-Based Vertical Light-Emitting Diodes Fabricated on β-Ga2O3 Substrate. Acs Applied Materials & Interfaces. PMID 28892352 DOI: 10.1021/Acsami.7B09584 |
0.335 |
|
| 2017 |
Lopatin S, Cheng B, Liu WT, Tsai ML, He JH, Chuvilin A. Optimization of monochromated TEM for ultimate resolution imaging and ultrahigh resolution electron energy loss spectroscopy. Ultramicroscopy. 184: 109-115. PMID 28886488 DOI: 10.1016/J.Ultramic.2017.08.016 |
0.323 |
|
| 2017 |
Govyadinov AA, Konečná A, Chuvilin A, Vélez S, Dolado I, Nikitin AY, Lopatin S, Casanova F, Hueso LE, Aizpurua J, Hillenbrand R. Probing low-energy hyperbolic polaritons in van der Waals crystals with an electron microscope. Nature Communications. 8: 95. PMID 28733660 DOI: 10.1038/S41467-017-00056-Y |
0.33 |
|
| 2017 |
Priante D, Janjua B, Prabaswara A, Subedi RC, Elafandy RT, Lopatin S, Anjum DH, Zhao C, Ng TK, Ooi BS. Highly uniform ultraviolet-A quantum-confined AlGaN nanowire LEDs on metal/silicon with a TaN interlayer Optical Materials Express. 7: 4214-4224. DOI: 10.1364/Ome.7.004214 |
0.356 |
|
| 2017 |
Lopatin S, Cheng B, Liu W, Tsai M, He J, Chuvilin A. Ultrahigh Resolution of Electron Energy Loss Spectroscopy by a Monochromated Titan TEM: Towards Challenging Nanomaterials Characterization Microscopy and Microanalysis. 23: 1564-1565. DOI: 10.1017/S1431927617008480 |
0.313 |
|
| 2016 |
Rossner C, Roddatis V, Lopatin S, Vana P. Functionalization of Planet-Satellite Nanostructures Revealed by Nanoscopic Localization of Distinct Macromolecular Species. Macromolecular Rapid Communications. PMID 27717056 DOI: 10.1002/Marc.201600480 |
0.32 |
|
| 2016 |
Ivanov YP, Chuvilin A, Lopatin S, Kosel J. Modulated Magnetic Nanowires for Controlling Domain Wall Motion: Toward 3D Magnetic Memories. Acs Nano. PMID 27138460 DOI: 10.1021/Acsnano.6B01337 |
0.324 |
|
| 2016 |
Lopatin S, Ivanov YP, Kosel J, Chuvilin A. Multiscale differential phase contrast analysis with a unitary detector. Ultramicroscopy. 162: 74-81. PMID 26780685 DOI: 10.1016/J.Ultramic.2015.12.008 |
0.313 |
|
| 2016 |
Skowron ST, Koroteev VO, Baldoni M, Lopatin S, Zurutuza A, Chuvilin A, Besley E. Reaction kinetics of bond rotations in graphene Carbon. 105: 176-182. DOI: 10.1016/J.Carbon.2016.04.020 |
0.311 |
|
| 2015 |
Marini M, Falqui A, Moretti M, Limongi T, Allione M, Genovese A, Lopatin S, Tirinato L, Das G, Torre B, Giugni A, Gentile F, Candeloro P, Di Fabrizio E. The structure of DNA by direct imaging. Science Advances. 1: e1500734. PMID 26601243 DOI: 10.1126/Sciadv.1500734 |
0.301 |
|
| 2013 |
Huth F, Chuvilin A, Schnell M, Amenabar I, Krutokhvostov R, Lopatin S, Hillenbrand R. Resonant antenna probes for tip-enhanced infrared near-field microscopy. Nano Letters. 13: 1065-72. PMID 23362918 DOI: 10.1021/Nl304289G |
0.323 |
|
| 2013 |
Vasiliev AL, Roddatis VV, Presnyakov MY, Orekhov AS, Lopatin S, Bondarenko VI, Koval’chuk MV. Microstructure of interfaces in heterosystems Nanotechnologies in Russia. 8: 317-327. DOI: 10.1134/S199507801303021X |
0.414 |
|
| 2012 |
Akbashev AR, Roddatis VV, Vasiliev AL, Lopatin S, Amelichev VA, Kaul AR. Reconstruction of the polar interface between hexagonal LuFeO3 and intergrown Fe3O4 nanolayers. Scientific Reports. 2: 672. PMID 22993697 DOI: 10.1038/Srep00672 |
0.301 |
|
| 2012 |
de la Mata M, Magen C, Gazquez J, Utama MI, Heiss M, Lopatin S, Furtmayr F, Fernández-Rojas CJ, Peng B, Morante JR, Rurali R, Eickhoff M, Fontcuberta i Morral A, Xiong Q, Arbiol J. Polarity assignment in ZnTe, GaAs, ZnO, and GaN-AlN nanowires from direct dumbbell analysis. Nano Letters. 12: 2579-86. PMID 22493937 DOI: 10.1021/Nl300840Q |
0.358 |
|
| 2012 |
Akbashev AR, Roddatis VV, Vasiliev AL, Lopatin S, Semisalova AS, Perov NS, Amelichev VA, Kaul AR. Reconstructed stacking faults in cobalt-doped hexagonal LuFeO3 revealed by mapping of cation distribution at the atomic scale Crystengcomm. 14: 5373. DOI: 10.1039/C2Ce25294E |
0.331 |
|
| 2004 |
Windl W, Liang T, Lopatin S, Duscher G. Investigation of Nanostructured Germanium/Silicon Dioxide Interfaces Journal of Computational and Theoretical Nanoscience. 1: 286-295. DOI: 10.1166/Jctn.2004.030 |
0.567 |
|
| 2004 |
Windl W, Liang T, Lopatin S, Duscher G. Modeling and characterization of atomically sharp “perfect” Ge/SiO2 interfaces Materials Science and Engineering B-Advanced Functional Solid-State Materials. 114: 156-161. DOI: 10.1016/J.Mseb.2004.07.041 |
0.567 |
|
| 2003 |
Lopatin S, Duscher G, Windl W. Atomic Resolution Z-contrast Imaging and EELS: Application for Ge/SiO2 Interface Microscopy and Microanalysis. 9: 818-819. DOI: 10.1017/S1431927603444097 |
0.569 |
|
| 2002 |
Lopatin S, Duscher G, Pennycook SJ, Chisholm MF. Z-contrast Imaging and EELS of Dislocation Cores at the Si/GaAs Interface Mrs Proceedings. 744. DOI: 10.1557/Proc-744-M1.6 |
0.609 |
|
| 2002 |
Lopatin S, Pennycook SJ, Narayan J, Duscher G. Z-contrast imaging of dislocation cores at the GaAs/Si interface Applied Physics Letters. 81: 2728-2730. DOI: 10.1063/1.1511808 |
0.582 |
|
| 2002 |
Lopatin S, Narayan J, Duscher G. Z-Contrast Imaging of Dislocation Cores at the Si/GaAs Interface Microscopy and Microanalysis. 8: 1604-1605. DOI: 10.1017/S1431927602104600 |
0.567 |
|
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