Ivan Petrov - Publications

Affiliations: 
Materials Science and Engineering University of Illinois, Urbana-Champaign, Urbana-Champaign, IL 

256 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Wu Z, Tengstrand O, Bakhit B, Lu J, Greene JE, Hultman L, Petrov I, Greczynski G. Growth of dense, hard yet low-stress Ti0.40Al0.27W0.33N nanocomposite films with rotating substrate and no external substrate heating Journal of Vacuum Science and Technology. 38: 23006. DOI: 10.1116/1.5140357  0.505
2020 Nedfors N, Primetzhofer D, Zhirkov I, Palisaitis J, Persson POÅ, Greene JE, Petrov I, Rosen J. The influence of pressure and magnetic field on the deposition of epitaxial TiBx thin films from DC magnetron sputtering Vacuum. 177: 109355. DOI: 10.1016/J.Vacuum.2020.109355  0.483
2020 Bakhit B, Palisaitis J, Persson POÅ, Alling B, Rosen J, Hultman L, Petrov I, Greene JE, Greczynski G. Self-organized columnar Zr0.7Ta0.3B1.5 core/shell-nanostructure thin films Surface & Coatings Technology. 401: 126237. DOI: 10.1016/J.Surfcoat.2020.126237  0.463
2020 Wu Z, Wang Q, Petrov I, Greene JE, Hultman L, Greczynski G. Cubic-structure Al-rich TiAlSiN thin films grown by hybrid high-power impulse magnetron co-sputtering with synchronized Al+ irradiation Surface & Coatings Technology. 385: 125364. DOI: 10.1016/J.Surfcoat.2020.125364  0.431
2020 Bakhit B, Palisaitis J, Thörnberg J, Rosen J, Persson POÅ, Hultman L, Petrov I, Greene JE, Greczynski G. Improving the high-temperature oxidation resistance of TiB2 thin films by alloying with Al Acta Materialia. 196: 677-689. DOI: 10.1016/J.Actamat.2020.07.025  0.414
2020 Mei AB, Kindlund H, Broitman E, Hultman L, Petrov I, Greene JE, Sangiovanni D. Adaptive hard and tough mechanical response in single-crystal B1 VNx ceramics via control of anion vacancies Acta Materialia. 192: 78-88. DOI: 10.1016/J.Actamat.2020.03.037  0.331
2019 Godoy YC, Tengstrand O, Florez JO, Petrov I, Bustos E, Hultman L, Herrera-Gomez A, Greene JE, Greczynski G. Corrosion Resistant TiTaN and TiTaAlN Thin Films Grown by Hybrid HiPIMS/DCMS Using Synchronized Pulsed Substrate Bias with No External Substrate Heating The Coatings. 9: 841. DOI: 10.3390/Coatings9120841  0.439
2019 Edström D, Sangiovanni D, Landälv L, Eklund P, Greene JE, Petrov I, Hultman L, Chirita V. Mechanical properties of VMoNO as a function of oxygen concentration: Toward development of hard and tough refractory oxynitrides Journal of Vacuum Science and Technology. 37: 61508. DOI: 10.1116/1.5125302  0.33
2019 Greczynski G, Petrov I, Greene JE, Hultman L. Paradigm shift in thin-film growth by magnetron sputtering: From gas-ion to metal-ion irradiation of the growing film Journal of Vacuum Science and Technology. 37: 60801. DOI: 10.1116/1.5121226  0.419
2019 Bakhit B, Engberg D, Lu J, Rosén J, Högberg H, Hultman L, Petrov I, Greene JE, Greczynski G. Strategy for simultaneously increasing both hardness and toughness in ZrB2-rich Zr1-xTaxBy thin films Journal of Vacuum Science and Technology. 37: 31506. DOI: 10.1116/1.5093170  0.502
2019 Hellgren N, Thörnberg J, Zhirkov I, Sortica MA, Petrov I, Greene JE, Hultman L, Rosén J. High-power impulse magnetron sputter deposition of TiBx thin films: Effects of pressure and growth temperature Vacuum. 169: 108884. DOI: 10.1016/J.Vacuum.2019.108884  0.419
2019 Petrov I, Hultman L, Stueber M, Chen L, Desjardins P. Preface of the special issue “Thin Films Advances” dedicated to the 75th birthday of Professor Joe Greene Thin Solid Films. 688: 137494. DOI: 10.1016/J.Tsf.2019.137494  0.364
2019 Kindlund H, Sangiovanni D, Petrov I, Greene JE, Hultman L. A review of the intrinsic ductility and toughness of hard transition-metal nitride alloy thin films Thin Solid Films. 688: 137479. DOI: 10.1016/J.Tsf.2019.137479  0.423
2019 Edström D, Sangiovanni D, Hultman L, Petrov I, Greene JE, Chirita V. TiN film growth on misoriented TiN grains with simultaneous low-energy bombardment: Restructuring leading to epitaxy Thin Solid Films. 688: 137380. DOI: 10.1016/J.Tsf.2019.06.030  0.464
2018 Ghafoor N, Petrov I, Holec D, Greczynski G, Palisaitis J, Persson POA, Hultman L, Birch J. Self-structuring in ZrAlN films as a function of composition and growth temperature. Scientific Reports. 8: 16327. PMID 30397271 DOI: 10.1038/S41598-018-34279-W  0.476
2018 Mühlbacher M, Greczynski G, Sartory B, Schalk N, Lu J, Petrov I, Greene JE, Hultman L, Mitterer C. Enhanced TiTaN diffusion barriers, grown by a hybrid sputtering technique with no substrate heating, between Si(001) wafers and Cu overlayers. Scientific Reports. 8: 5360. PMID 29599468 DOI: 10.1038/S41598-018-23782-9  0.473
2018 Villamayor MMS, Keraudy J, Shimizu T, Viloan RPB, Boyd R, Lundin D, Greene JE, Petrov I, Helmersson U. Low temperature (Ts/Tm < 0.1) epitaxial growth of HfN/MgO(001) via reactive HiPIMS with metal-ion synchronized substrate bias Journal of Vacuum Science and Technology. 36: 61511. DOI: 10.1116/1.5052702  0.502
2018 Kindlund H, Lu J, Broitman E, Petrov I, Greene JE, Birch J, Hultman L. Growth and mechanical properties of 111-oriented V0.5Mo0.5Nx/Al2O3(0001) thin films Journal of Vacuum Science and Technology. 36: 51512. DOI: 10.1116/1.5045048  0.407
2018 Bakhit B, Petrov I, Greene JE, Hultman L, Rosén J, Greczynski G. Controlling the B/Ti ratio of TiBx thin films grown by high-power impulse magnetron sputtering Journal of Vacuum Science and Technology. 36: 30604. DOI: 10.1116/1.5026445  0.489
2018 Greczynski G, Zhirkov I, Petrov I, Greene JE, Rosén J. Time evolution of ion fluxes incident at the substrate plane during reactive high-power impulse magnetron sputtering of groups IVb and VIb transition metals in Ar/N2 Journal of Vacuum Science and Technology. 36: 20602. DOI: 10.1116/1.5016241  0.432
2018 Sangiovanni D, Mei AB, Edström D, Hultman L, Chirita V, Petrov I, Greene JE. Effects of surface vibrations on interlayer mass transport: Ab initio molecular dynamics investigation of Ti adatom descent pathways and rates from TiN/TiN(001) islands Physical Review B. 97: 35406. DOI: 10.1103/Physrevb.97.035406  0.313
2018 Mozetič M, Vesel A, Primc G, Eisenmenger-Sittner C, Bauer J, Eder A, Schmid G, Ruzic D, Ahmed Z, Barker D, Douglass K, Eckel S, Fedchak J, Hendricks J, Klimov N, ... ... Petrov I, et al. Recent developments in surface science and engineering, thin films, nanoscience, biomaterials, plasma science, and vacuum technology Thin Solid Films. 660: 120-160. DOI: 10.1016/J.Tsf.2018.05.046  0.405
2017 Greczynski G, Zhirkov I, Petrov I, Greene JE, Rosén J. Gas rarefaction effects during high power pulsed magnetron sputtering of groups IVb and VIb transition metals in Ar Journal of Vacuum Science and Technology. 35: 60601. DOI: 10.1116/1.4989674  0.339
2017 Petrov I, Hall A, Mei AB, Nedfors N, Zhirkov I, Rosen J, Reed A, Howe B, Greczynski G, Birch J, Hultman L, Greene JE. Controlling the boron-to-titanium ratio in magnetron-sputter-deposited TiBx thin films Journal of Vacuum Science and Technology. 35: 50601. DOI: 10.1116/1.4982649  0.785
2017 Zheng Q, Mei AB, Tuteja M, Sangiovanni DG, Hultman L, Petrov I, Greene JE, Cahill DG. Phonon and electron contributions to the thermal conductivity of VNx epitaxial layers Physical Review Materials. 1. DOI: 10.1103/Physrevmaterials.1.065002  0.375
2017 Fager H, Tengstrand O, Lu J, Bolz S, Mesic B, Kölker W, Schiffers C, Lemmer O, Greene JE, Hultman L, Petrov I, Greczynski G. Low-temperature growth of dense and hard Ti0.41Al0.51Ta0.08N films via hybrid HIPIMS/DC magnetron co-sputtering with synchronized metal-ion irradiation Journal of Applied Physics. 121: 171902. DOI: 10.1063/1.4977818  0.489
2017 Edström D, Sangiovanni D, Hultman L, Petrov I, Greene JE, Chirita V. Effects of incident N atom kinetic energy on TiN/TiN(001) film growth dynamics: A molecular dynamics investigation Journal of Applied Physics. 121: 25302. DOI: 10.1063/1.4972963  0.474
2017 Greczynski G, Zhirkov I, Petrov I, Greene JE, Rosén J. Control of the metal/gas ion ratio incident at the substrate plane during high-power impulse magnetron sputtering of transition metals in Ar Thin Solid Films. 642: 36-40. DOI: 10.1016/J.Tsf.2017.09.027  0.312
2017 Kindlund H, Greczynski G, Broitman E, Martínez-de-Olcoz L, Lu J, Jensen J, Petrov I, Greene JE, Birch J, Hultman L. V0.5Mo0.5Nx/MgO(001): Composition, nanostructure, and mechanical properties as a function of film growth temperature Acta Materialia. 126: 194-201. DOI: 10.1016/J.Actamat.2016.12.048  0.432
2016 Edström D, Sangiovanni D, Hultman L, Petrov I, Greene JE, Chirita V. Large-scale molecular dynamics simulations of TiN/TiN(001) epitaxial film growth Journal of Vacuum Science and Technology. 34: 41509. DOI: 10.1116/1.4953404  0.406
2016 Mei AB, Tuteja M, Sangiovanni D, Haasch RT, Rockett A, Hultman L, Petrov I, Greene JE. Growth, nanostructure, and optical properties of epitaxial VNx/MgO(001) (0.80 ≤ x ≤ 1.00) layers deposited by reactive magnetron sputtering Journal of Materials Chemistry C. 4: 7924-7938. DOI: 10.1039/C6Tc02289H  0.451
2016 Sangiovanni D, Mei AB, Hultman L, Chirita V, Petrov I, Greene JE. Ab Initio Molecular Dynamics Simulations of Nitrogen/VN(001) Surface Reactions: Vacancy-Catalyzed N2 Dissociative Chemisorption, N Adatom Migration, and N2 Desorption Journal of Physical Chemistry C. 120: 12503-12516. DOI: 10.1021/Acs.Jpcc.6B02652  0.303
2016 Greczynski G, Lu J, Tengstrand O, Petrov I, Greene JE, Hultman L. Nitrogen-doped bcc-Cr films: Combining ceramic hardness with metallic toughness and conductivity Scripta Materialia. 122: 40-44. DOI: 10.1016/J.Scriptamat.2016.05.011  0.394
2016 Hellgren N, Haasch RT, Schmidt S, Hultman L, Petrov I. Interpretation of X-ray photoelectron spectra of carbon-nitride thin films: New insights from in situ XPS Carbon. 108: 242-252. DOI: 10.1016/J.Carbon.2016.07.017  0.485
2016 Sangiovanni DG, Hultman L, Chirita V, Petrov I, Greene JE. Effects of phase stability, lattice ordering, and electron density on plastic deformation in cubic TiWN pseudobinary transition-metal nitride alloys Acta Materialia. 103: 823-835. DOI: 10.1016/J.Actamat.2015.10.039  0.377
2015 Fager H, Howe BM, Greczynski G, Jensen J, Mei AB, Lu J, Hultman L, Greene JE, Petrov I. Novel hard, tough HfAlSiN multilayers, defined by alternating Si bond structure, deposited using modulated high-flux, low-energy ion irradiation of the growing film Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 33. DOI: 10.1116/1.4920980  0.759
2015 Greczynski G, Petrov I, Greene JE, Hultman L. Al capping layers for nondestructive x-ray photoelectron spectroscopy analyses of transition-metal nitride thin films Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 33. DOI: 10.1116/1.4916239  0.487
2015 Mei AB, Hellman O, Schlepütz CM, Rockett A, Chiang TC, Hultman L, Petrov I, Greene JE. Reflection thermal diffuse x-ray scattering for quantitative determination of phonon dispersion relations Physical Review B - Condensed Matter and Materials Physics. 92. DOI: 10.1103/Physrevb.92.174301  0.336
2015 Mei AB, Hellman O, Wireklint N, Schlepütz CM, Sangiovanni DG, Alling B, Rockett A, Hultman L, Petrov I, Greene JE. Dynamic and structural stability of cubic vanadium nitride Physical Review B - Condensed Matter and Materials Physics. 91. DOI: 10.1103/Physrevb.91.054101  0.363
2015 Greczynski G, Petrov I, Greene JE, Hultman L. Strategy for tuning the average charge state of metal ions incident at the growing film during HIPIMS deposition Vacuum. 116: 36-41. DOI: 10.1016/J.Vacuum.2015.02.027  0.373
2015 Edström D, Sangiovanni DG, Hultman L, Petrov I, Greene JE, Chirita V. The dynamics of TiNx (x = 1-3) admolecule interlayer and intralayer transport on TiN/TiN(001) islands Thin Solid Films. 589: 133-144. DOI: 10.1016/J.Tsf.2015.05.013  0.326
2015 Greczynski G, Patscheider J, Lu J, Alling B, Ektarawong A, Jensen J, Petrov I, Greene JE, Hultman L. Control of Ti1-xSixN nanostructure via tunable metal-ion momentum transfer during HIPIMS/DCMS co-deposition Surface and Coatings Technology. 280: 174-184. DOI: 10.1016/J.Surfcoat.2015.09.001  0.336
2015 Ghafoor N, Petrov I, Klenov DO, Freitag B, Jensen J, Greene JE, Hultman L, Odén M. Self-organized anisotropic (Zr1-xSix)Ny nanocomposites grown by reactive sputter deposition Acta Materialia. 82: 179-189. DOI: 10.1016/J.Actamat.2014.09.029  0.508
2014 Cho J, Losego MD, Zhang HG, Kim H, Zuo J, Petrov I, Cahill DG, Braun PV. Electrochemically tunable thermal conductivity of lithium cobalt oxide. Nature Communications. 5: 4035. PMID 24892640 DOI: 10.1038/Ncomms5035  0.314
2014 Greczynski G, Jensen J, Greene JE, Petrov I, Hultman L. X-ray Photoelectron Spectroscopy Analyses of the Electronic Structure of Polycrystalline Ti1-xAlxN Thin Films with 0 ≤ x ≤ 0.96 Surface Science Spectra. 21: 35-49. DOI: 10.1116/11.20140506  0.502
2014 Greczynski G, Lu J, Bolz S, Kölker W, Schiffers C, Lemmer O, Petrov I, Greene JE, Hultman L. Novel strategy for low-temperature, high-rate growth of dense, hard, and stress-free refractory ceramic thin films Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 32. DOI: 10.1116/1.4884575  0.529
2014 Kindlund H, Sangiovanni DG, Lu J, Jensen J, Chirita V, Petrov I, Greene JE, Hultman L. Effect of WN content on toughness enhancement in V1-xW xN/MgO(001) thin films Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 32. DOI: 10.1116/1.4867610  0.388
2014 Mei AB, Wilson RB, Li D, Cahill DG, Rockett A, Birch J, Hultman L, Greene JE, Petrov I. Elastic constants, Poisson ratios, and the elastic anisotropy of VN(001), (011), and (111) epitaxial layers grown by reactive magnetron sputter deposition Journal of Applied Physics. 115. DOI: 10.1063/1.4881817  0.361
2014 Edström D, Sangiovanni DG, Hultman L, Chirita V, Petrov I, Greene JE. Ti and N adatom descent pathways to the terrace from atop two-dimensional TiN/TiN(001) islands Thin Solid Films. 558: 37-46. DOI: 10.1016/J.Tsf.2014.02.053  0.345
2014 Greczynski G, Lu J, Jensen J, Petrov I, Greene JE, Bolz S, Kölker W, Schiffers C, Lemmer O, Hultman L. Strain-free, single-phase metastable Ti0.38Al0.62N alloys with high hardness: Metal-ion energy vs. momentum effects during film growth by hybrid high-power pulsed/dc magnetron cosputtering Thin Solid Films. 556: 87-98. DOI: 10.1016/J.Tsf.2014.01.017  0.46
2014 Sangiovanni DG, Edströma D, Hultmana L, Petrov I, Greene JE, Chirita V. Ti adatom diffusion on TiN(001): Ab initio and classical molecular dynamics simulations Surface Science. 627: 34-41. DOI: 10.1016/J.Susc.2014.04.007  0.325
2014 Sangiovanni DG, Edström D, Hultman L, Petrov I, Greene JE, Chirita V. Ab initio and classical molecular dynamics simulations of N2 desorption from TiN(001) surfaces Surface Science. 624: 25-31. DOI: 10.1016/J.Susc.2014.01.007  0.308
2014 Hovsepian PE, Ehiasarian AP, Petrov I. Structure evolution and properties of TiAlCN/VCN coatings deposited by reactive HIPIMS Surface and Coatings Technology. 257: 38-47. DOI: 10.1016/J.Surfcoat.2014.07.065  0.382
2014 Eriksson AO, Tengstrand O, Lu J, Jensen J, Eklund P, Rosén J, Petrov I, Greene JE, Hultman L. Si incorporation in Ti1-xSixN films grown on TiN(001) and (001)-faceted TiN(111) columns Surface and Coatings Technology. 257: 121-128. DOI: 10.1016/J.Surfcoat.2014.05.043  0.516
2014 Kindlund H, Sangiovanni DG, Lu J, Jensen J, Chirita V, Birch J, Petrov I, Greene JE, Hultman L. Vacancy-induced toughening in hard single-crystal V0.5Mo 0.5Nx/MgO(0 0 1) thin films Acta Materialia. 77: 394-400. DOI: 10.1016/J.Actamat.2014.06.025  0.405
2013 Xu S, Zhang Y, Cho J, Lee J, Huang X, Jia L, Fan JA, Su Y, Su J, Zhang H, Cheng H, Lu B, Yu C, Chuang C, Kim TI, ... ... Petrov I, et al. Stretchable batteries with self-similar serpentine interconnects and integrated wireless recharging systems. Nature Communications. 4: 1543. PMID 23443571 DOI: 10.1038/Ncomms2553  0.331
2013 Greczynski G, Kindlund H, Petrov I, Greene JE, Hultman L. Sputter-cleaned Epitaxial VxMo(1-x)Ny/MgO(001) Thin Films Analyzed by X-ray Photoelectron Spectroscopy: 3. Polycrystalline V0.49Mo0.51N1.02 Surface Science Spectra. 20: 80-85. DOI: 10.1116/11.20130602  0.504
2013 Greczynski G, Kindlund H, Petrov I, Greene JE, Hultman L. Sputter-cleaned Epitaxial VxMo(1-x)Ny/MgO(001) Thin Films Analyzed by X-ray Photoelectron Spectroscopy: 2. Single-crystal V0.47Mo0.53N0.92 Surface Science Spectra. 20: 74-79. DOI: 10.1116/11.20130601  0.511
2013 Mei AB, Howe BM, Zhang C, Sardela M, Eckstein JN, Hultman L, Rockett A, Petrov I, Greene JE. Physical properties of epitaxial ZrN/MgO(001) layers grown by reactive magnetron sputtering Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 31: 061516. DOI: 10.1116/1.4825349  0.736
2013 Kindlund H, Lu J, Jensen J, Petrov I, Greene JE, Hultman L. Epitaxial V0.6W0.4N/MgO(001): Evidence for ordering on the cation sublattice Journal of Vacuum Science and Technology. 31: 40602. DOI: 10.1116/1.4807654  0.344
2013 Kindlund H, Sangiovanni D, Martínez-de-Olcoz L, Lu J, Jensen J, Birch J, Petrov I, Greene J, Chirita V, Hultman L. Toughness enhancement in hard ceramic thin films by alloy design Apl Materials. 1: 42104. DOI: 10.1063/1.4822440  0.409
2013 Ghafoor N, Johnson LJS, Klenov DO, Demeulemeester J, Desjardins P, Petrov I, Hultman L, Odén M. Nanolabyrinthine ZrAlN thin films by self-organization of interwoven single-crystal cubic and hexagonal phases Apl Materials. 1. DOI: 10.1063/1.4818170  0.371
2013 Bettge M, Li Y, Sankaran B, Rago ND, Spila T, Haasch RT, Petrov I, Abraham DP. Improving high-capacity Li1.2Ni0.15Mn 0.55Co0.1O2-based lithium-ion cells by modifiying the positive electrode with alumina Journal of Power Sources. 233: 346-357. DOI: 10.1016/J.Jpowsour.2013.01.082  0.319
2012 Bettge M, MacLaren S, Burdin S, Haasch RT, Abraham D, Petrov I, Yu MF, Sammann E. Ion-induced surface relaxation: controlled bending and alignment of nanowire arrays. Nanotechnology. 23: 175302. PMID 22481483 DOI: 10.1088/0957-4484/23/17/175302  0.338
2012 Haasch RT, Patscheider J, Hellgren N, Petrov I, Greene JE. The Si3N4/TiN Interface: An Introduction to a Series of Ultrathin Films Grown and Analyzed In situ using X-ray Photoelectron Spectroscopy Surface Science Spectra. 19: 30-32. DOI: 10.1116/11.20121108  0.435
2012 Haasch RT, Patscheider J, Hellgren N, Petrov I, Greene JE. The Si3N4/TiN Interface: 7. Ti/TiN(001) Grown and Analyzed In situ using X-ray Photoelectron Spectroscopy Surface Science Spectra. 19: 92-97. DOI: 10.1116/11.20121007  0.468
2012 Haasch RT, Patscheider J, Hellgren N, Petrov I, Greene JE. The Si3N4/TiN Interface: 6. Si/TiN(001) Grown and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surface Science Spectra. 19: 82-91. DOI: 10.1116/11.20121006  0.456
2012 Haasch RT, Patscheider J, Hellgren N, Petrov I, Greene JE. The Si3N4/TiN Interface: 4. Si3N4/TiN(001) Grown with a −250 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surface Science Spectra. 19: 62-71. DOI: 10.1116/11.20121004  0.461
2012 Haasch RT, Patscheider J, Hellgren N, Petrov I, Greene JE. The Si3N4/TiN Interface: 1. TiN(001) Grown and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surface Science Spectra. 19: 33-41. DOI: 10.1116/11.20121001  0.457
2012 Greczynski G, Lu J, Jensen J, Petrov I, Greene JE, Bolz S, Kölker W, Schiffers C, Lemmer O, Hultman L. Metal versus rare-gas ion irradiation during Ti1−xAlxN film growth by hybrid high power pulsed magnetron/dc magnetron co-sputtering using synchronized pulsed substrate bias Journal of Vacuum Science and Technology. 30: 61504. DOI: 10.1116/1.4750485  0.399
2012 Murata Y, Petrova V, Petrov I, Ciobanu CV, Kodambaka S. Role of ethylene on surface oxidation of TiO2(110) Applied Physics Letters. 101. DOI: 10.1063/1.4767954  0.306
2012 Greczynski G, Lu J, Johansson M, Jensen J, Petrov I, Greene JE, Hultman L. Selection of metal ion irradiation for controlling Ti1-xAlxN alloy growth via hybrid HIPIMS/magnetron co-sputtering Vacuum. 86: 1036-1040. DOI: 10.1016/J.Vacuum.2011.10.027  0.367
2012 Greczynski G, Lu J, Johansson MP, Jensen J, Petrov I, Greene JE, Hultman L. Role of Ti n+ and Al n+ ion irradiation (n=1, 2) during Ti 1-xAl xN alloy film growth in a hybrid HIPIMS/magnetron mode Surface and Coatings Technology. 206: 4202-4211. DOI: 10.1016/J.Surfcoat.2012.04.024  0.497
2012 Bettge M, Ryu SY, MacLaren S, Burdin S, Petrov I, Yu MF, Sammann E, Abraham DP. Hierarchically textured Li xMn 2-yO 4 thin films as positive electrodes for lithium-ion batteries Journal of Power Sources. 206: 288-294. DOI: 10.1016/J.Jpowsour.2012.01.128  0.394
2011 Patscheider J, Hellgren N, Haasch RT, Petrov I, Greene JE. Electronic structure of the SiN x /TiN interface: A model system for superhard nanocomposites Physical Review B. 83: 125124. DOI: 10.1103/Physrevb.83.125124  0.391
2011 Stoehr M, Shin C-, Petrov I, Greene JE. Raman scattering from TiNx (0.67 ≤ x ≤ 1.00) single crystals grown on MgO(001) Journal of Applied Physics. 110: 83503. DOI: 10.1063/1.3651381  0.362
2011 Cho B, Bareño J, Petrov I, Greene JE. Enhanced Ge/Si(001) island areal density and self-organization due to P predeposition Journal of Applied Physics. 109: 93526. DOI: 10.1063/1.3587226  0.348
2011 Bareño J, Balasubramanian M, Kang SH, Wen JG, Lei CH, Pol SV, Petrov I, Abraham DP. Long-Range and Local Structure in the Layered Oxide Li1.2Co0.4Mn0.4O2 Chemistry of Materials. 23: 2039-2050. DOI: 10.1021/Cm200250A  0.325
2011 Wen JG, Bareño J, Lei CH, Kang SH, Balasubramanian M, Petrov I, Abraham DP. Analytical electron microscopy of Li1.2Co0.4Mn0.4O2 for lithium-ion batteries Solid State Ionics. 182: 98-107. DOI: 10.1016/J.Ssi.2010.11.030  0.332
2011 Howe BM, Sammann E, Wen JG, Spila T, Greene JE, Hultman L, Petrov I. Real-time control of AlN incorporation in epitaxial Hf1 − xAlxN using high-flux, low-energy (10–40 eV) ion bombardment during reactive magnetron sputter deposition from a Hf0.7Al0.3 alloy target Acta Materialia. 59: 421-428. DOI: 10.1016/J.Actamat.2010.08.023  0.511
2010 Murata Y, Petrova V, Kappes BB, Ebnonnasir A, Petrov I, Xie YH, Ciobanu CV, Kodambaka S. Moiré superstructures of graphene on faceted nickel islands. Acs Nano. 4: 6509-14. PMID 20945924 DOI: 10.1021/Nn102446Y  0.303
2010 Unarunotai S, Koepke JC, Tsai CL, Du F, Chialvo CE, Murata Y, Haasch R, Petrov I, Mason N, Shim M, Lyding J, Rogers JA. Layer-by-layer transfer of multiple, large area sheets of graphene grown in multilayer stacks on a single SiC wafer. Acs Nano. 4: 5591-8. PMID 20843091 DOI: 10.1021/Nn101896A  0.387
2010 Shah AB, Ramasse QM, Zhai X, Wen JG, May SJ, Petrov I, Bhattacharya A, Abbamonte P, Eckstein JN, Zuo JM. Probing interfacial electronic structures in atomic layer LaMnO(3) and SrTiO(3) superlattices. Advanced Materials (Deerfield Beach, Fla.). 22: 1156-60. PMID 20401940 DOI: 10.1002/Adma.200904198  0.336
2010 Bareño J, Lei CH, Wen JG, Kang S‐, Petrov I, Abraham DP. Local Structure of Layered Oxide Electrode Materials for Lithium‐Ion Batteries Advanced Materials. 22: 1122-1127. PMID 20401936 DOI: 10.1002/Adma.200904247  0.336
2010 Curiel M, Petrov I, Nedev N, Nesheva D, Sardela MR, Murata Y, Valdez B, Manolov E, Bineva I. Formation of Si Nanocrystals in Thin SiO2 Films for Memory Device Applications Materials Science Forum. 644: 101-104. DOI: 10.4028/Www.Scientific.Net/Msf.644.101  0.444
2010 Hovsepian P, Ehiasarian A, Petrov I. TiAlCN/VCN nanolayer coatings suitable for machining of Al and Ti alloys deposited by combined high power impulse magnetron sputtering/unbalanced magnetron sputtering Surface Engineering. 26: 610-614. DOI: 10.1179/026708408X336337  0.411
2010 Lee T, Seo H, Hwang H, Howe B, Kodambaka S, Greene J, Petrov I. Fully strained low-temperature epitaxy of TiN/MgO(001) layers using high-flux, low-energy ion irradiation during reactive magnetron sputter deposition Thin Solid Films. 518: 5169-5172. DOI: 10.1016/J.Tsf.2010.04.028  0.506
2010 Curiel MA, Nedev N, Nesheva D, Soares J, Haasch R, Sardela M, Valdez B, Sankaran B, Manolov E, Bineva I, Petrov I. Microstructural characterization of thin SiOx films obtained by physical vapor deposition Materials Science and Engineering B-Advanced Functional Solid-State Materials. 174: 132-136. DOI: 10.1016/J.Mseb.2010.03.007  0.508
2010 Seo HC, Petrov I, Kim K. Structural Properties of AlN Grown on Sapphire at Plasma Self-Heating Conditions Using Reactive Magnetron Sputter Deposition Journal of Electronic Materials. 39: 1146-1151. DOI: 10.1007/S11664-010-1275-4  0.521
2010 Terrazas JM, Nedev N, Manolov E, Valdez B, Nesheva D, Curiel MA, Haasch R, Petrov I. Effect of oxygen to argon ratio on the properties of thin SiO x films deposited by r.f. sputtering Journal of Materials Science: Materials in Electronics. 21: 481-485. DOI: 10.1007/S10854-009-9942-Z  0.451
2009 Bettge M, MacLaren S, Burdin S, Wen JG, Abraham D, Petrov I, Sammann E. Low-temperature vapour-liquid-solid (VLS) growth of vertically aligned silicon oxide nanowires using concurrent ion bombardment. Nanotechnology. 20: 115607. PMID 19420447 DOI: 10.1088/0957-4484/20/11/115607  0.454
2009 Ondrejcek M, Swiech W, Petrov I, Rajappan M, Flynn CP. LEEM investigations of surfaces using a beam of energetic self-ions. Microscopy Research and Technique. 72: 197-207. PMID 19170160 DOI: 10.1002/Jemt.20672  0.334
2009 Unarunotai S, Murata Y, Chialvo CE, Kim HS, MacLaren S, Mason N, Petrov I, Rogers JA. Transfer of graphene layers grown on SiC wafers to other substrates and their integration into field effect transistors Applied Physics Letters. 95. DOI: 10.1063/1.3263942  0.349
2009 Seo HC, Petrov I, Jeong H, Chapman P, Kim K. Elastic buckling of AlN ribbons on elastomeric substrate Applied Physics Letters. 94: 92104. DOI: 10.1063/1.3081632  0.451
2009 Lei CH, Wen JG, Sardela M, Bareño J, Petrov I, Kang S-, Abraham DP. Structural study of Li2MnO3 by electron microscopy Journal of Materials Science. 44: 5579-5587. DOI: 10.1007/S10853-009-3784-1  0.341
2008 Schultz MJ, Zhang X, Unarunotai S, Khang DY, Cao Q, Wang C, Lei C, MacLaren S, Soares JA, Petrov I, Moore JS, Rogers JA. Synthesis of linked carbon monolayers: films, balloons, tubes, and pleated sheets. Proceedings of the National Academy of Sciences of the United States of America. 105: 7353-8. PMID 18508969 DOI: 10.1073/Pnas.0710081105  0.357
2008 Swiech W, Rajappan M, Ondrejcek M, Sammann E, Burdin S, Petrov I, Flynn CP. Real-time imaging of surface evolution driven by variable-energy ion irradiation. Ultramicroscopy. 108: 646-55. PMID 18063481 DOI: 10.1016/J.Ultramic.2007.10.005  0.328
2008 Stoehr M, Seo H-, Petrov I, Greene JE. Effect of off stoichiometry on Raman scattering from epitaxial and polycrystalline HfNx (0.85≤x≤ 1.50) grown on MgO(001) Journal of Applied Physics. 104: 33507. DOI: 10.1063/1.2961332  0.342
2008 Cho B, Bareño J, Foo YL, Hong S, Spila T, Petrov I, Greene JE. Phosphorus incorporation during Si(001):P gas-source molecular beam epitaxy: Effects on growth kinetics and surface morphology Journal of Applied Physics. 103: 123530. DOI: 10.1063/1.2925798  0.398
2008 Lei CH, Bareño J, Wen JG, Petrov I, Kang S-, Abraham DP. Local structure and composition studies of Li1.2Ni0.2Mn0.6O2 by analytical electron microscopy Journal of Power Sources. 178: 422-433. DOI: 10.1016/J.Jpowsour.2007.11.077  0.363
2008 Audronis M, Leyland A, Matthews A, Wen JG, Petrov I. Characterization studies of pulse magnetron sputtered hard ceramic titanium diboride coatings alloyed with silicon Acta Materialia. 56: 4172-4182. DOI: 10.1016/J.Actamat.2008.04.047  0.465
2007 Park YM, Ko DS, Yi KW, Petrov I, Kim YW. Measurement and estimation of temperature rise in TEM sample during ion milling. Ultramicroscopy. 107: 663-8. PMID 17307292 DOI: 10.1016/J.Ultramic.2007.01.002  0.339
2007 Ehiasarian AP, Anders A, Petrov I. Combined filtered cathodic arc etching pretreatment–magnetron sputter deposition of highly adherent CrN films Journal of Vacuum Science and Technology. 25: 543-550. DOI: 10.1116/1.2730512  0.472
2007 Hultman L, Bareño J, Flink A, Söderberg H, Larsson K, Petrova V, Odén M, Greene JE, Petrov I. Interface structure in superhard TiN-SiN nanolaminates and nanocomposites : film growth experiments and ab initio calculations Physical Review B. 75: 155437. DOI: 10.1103/Physrevb.75.155437  0.373
2007 Stoehr M, Shin C-, Petrov I, Greene JE. Raman scattering from epitaxial TaNx (0.94 ≤x≤ 1.37) layers grown on MgO(001) Journal of Applied Physics. 101: 123509. DOI: 10.1063/1.2748354  0.302
2007 Ehiasarian AP, Wen JG, Petrov I. Interface microstructure engineering by high power impulse magnetron sputtering for the enhancement of adhesion Journal of Applied Physics. 101: 54301. DOI: 10.1063/1.2697052  0.338
2007 Howe B, Bareño J, Sardela M, Wen JG, Greene JE, Hultman L, Voevodin AA, Petrov I. Growth and physical properties of epitaxial metastable Hf1 − xAlxN alloys deposited on MgO(001) by ultrahigh vacuum reactive magnetron sputtering Surface & Coatings Technology. 202: 809-814. DOI: 10.1016/J.Surfcoat.2007.05.079  0.726
2007 Persson P, Kodambaka S, Petrov I, Hultman L. Epitaxial Ti2AlN(0 0 0 1) thin film deposition by dual-target reactive magnetron sputtering Acta Materialia. 55: 4401-4407. DOI: 10.1016/J.Actamat.2007.04.006  0.507
2006 Tang SJ, Kodambaka S, Swiech W, Petrov I, Flynn CP, Chiang TC. Sublimation of atomic layers from a chromium surface. Physical Review Letters. 96: 126106. PMID 16605934 DOI: 10.1103/Physrevlett.96.126106  0.361
2006 Kok YN, Wen JG, Petrov I, Hovsepian PE. Influence of ion bombardment on structure and tribological performance of nanoscale multilayer C/Cr PVD coatings Surface Engineering. 22: 92-98. DOI: 10.1179/174329406X98377  0.331
2006 Faraci G, Pennisi AR, Zontone F, Li B, Petrov I. Expansion and melting of Xe nanocrystals in Si Physical Review B. 74: 235436. DOI: 10.1103/Physrevb.74.235436  0.363
2006 Mayrhofer PH, Mitterer C, Wen JG, Petrov I, Greene JE. Thermally induced self-hardening of nanocrystalline Ti-B-N thin films Journal of Applied Physics. 100: 44301. DOI: 10.1063/1.2222406  0.487
2006 Lim CW, Greene JE, Petrov I. CoSi2 growth on Si(001) by reactive deposition epitaxy: Effects of high-flux, low-energy ion irradiation Journal of Applied Physics. 100: 13510. DOI: 10.1063/1.2213351  0.482
2006 Wen J, Mayrhofer P, Mitterer C, Greene J, Petrov I. Self-hardening of Nanocrystalline Ti-B-N Thin Films Microscopy and Microanalysis. 12: 720-721. DOI: 10.1017/S1431927606067559  0.381
2006 Lim CW, Petrov I, Greene JE. Epitaxial growth of CoSi2 on Si(001) by reactive deposition epitaxy: Island growth and coalescence Thin Solid Films. 515: 1340-1348. DOI: 10.1016/J.Tsf.2006.03.043  0.386
2006 Bareño J, Kodambaka S, Khare SV, Świech W, Petrov I, Greene JE. Orientation-dependent mobilities from analyses of two-dimensional TiN(111) island decay kinetics Thin Solid Films. 510: 339-345. DOI: 10.1016/J.Tsf.2005.12.164  0.31
2006 Kodambaka S, Khare SV, Petrov I, Greene JE. Two-dimensional island dynamics: Role of step energy anisotropy Surface Science Reports. 60: 55-77. DOI: 10.1016/J.Surfrep.2005.10.002  0.302
2006 Vitanov P, Harizanova A, Petrov I, Alexieva Z, Dimitrova T. Deposition and Properties of Thin (ZrO2)x(Al2O3)1-x Films on Silicon Plasma Processes and Polymers. 3: 179-183. DOI: 10.1002/Ppap.200500132  0.421
2005 Ohmori K, Foo YL, Hong S, Wen JG, Greene JE, Petrov I. Directed self-assembly of Ge nanostructures on very high index, highly anisotropic Si(hkl) surfaces. Nano Letters. 5: 369-72. PMID 15794627 DOI: 10.1021/Nl048340W  0.328
2005 Kodambaka S, Barẽo J, Khare SV, Świȩch W, Petrov I, Greene JE. Nucleation and growth kinetics of spiral steps on TiN(111): An in situ low-energy electron microscopy study Journal of Applied Physics. 98. DOI: 10.1063/1.1977193  0.369
2005 Mayrhofer PH, Mitterer C, Wen JG, Greene JE, Petrov I. Self-organized nanocolumnar structure in superhard TiB2 thin films Applied Physics Letters. 86: 131909. DOI: 10.1063/1.1887824  0.431
2005 Seo H, Lee T, Petrov I, Greene JE, Gall D. Epitaxial and polycrystalline HfNx (0.8⩽x⩽1.5) layers on MgO(001): Film growth and physical properties Journal of Applied Physics. 97: 083521. DOI: 10.1063/1.1870097  0.481
2005 Lim CW, Shin C-, Gall D, Zuo JM, Petrov I, Greene JE. Growth of CoSi2 on Si(001) by reactive deposition epitaxy Journal of Applied Physics. 97: 44909. DOI: 10.1063/1.1774263  0.46
2005 Kok YN, Hovsepian PE, Luo Q, Lewis DB, Wen JG, Petrov I. Influence of the bias voltage on the structure and the tribological performance of nanoscale multilayer C/Cr PVD coatings Thin Solid Films. 475: 219-226. DOI: 10.1016/J.Tsf.2004.08.042  0.308
2005 Lee GR, Lee JJ, Shin CS, Petrov I, Greene JE. Self-organized lamellar structured tantalum–nitride by UHV unbalanced-magnetron sputtering Thin Solid Films. 475: 45-48. DOI: 10.1016/J.Tsf.2004.07.070  0.481
2005 Wall MA, Cahill DG, Petrov I, Gall D, Greene JE. Nucleation kinetics versus nitrogen partial pressure during homoepitaxial growth of stoichiometric TiN(0 0 1): A scanning tunneling microscopy study Surface Science. 581: L122-L127. DOI: 10.1016/J.Susc.2005.03.007  0.412
2005 Hovsepian PE, Kok YN, Ehiasarian AP, Haasch R, Wen J-, Petrov I. Phase separation and formation of the self-organised layered nanostructure in C/Cr coatings in conditions of high ion irradiation Surface & Coatings Technology. 200: 1572-1579. DOI: 10.1016/J.Surfcoat.2005.08.095  0.445
2005 Kok YN, Hovsepian PE, Haasch R, Petrov I. Raman spectroscopy study of C/Cr coatings deposited by the combined steered cathodic ARC/unbalanced magnetron sputtering technique Surface & Coatings Technology. 200: 1117-1122. DOI: 10.1016/J.Surfcoat.2005.02.023  0.367
2004 Kodambaka S, Khare SV, Swiech W, Ohmori K, Petrov I, Greene JE. Dislocation-driven surface dynamics on solids. Nature. 429: 49-52. PMID 15129275 DOI: 10.1038/Nature02495  0.32
2004 Bjurstrom J, Rosen D, Katardjiev I, Yanchev VM, Petrov I. Dependence of the electromechanical coupling on the degree of orientation of c-textured thin AlN films Ieee Transactions On Ultrasonics Ferroelectrics and Frequency Control. 51: 1347-1353. DOI: 10.1109/Tuffc.2004.1350963  0.41
2004 Wall MA, Cahill DG, Petrov I, Gall D, Greene JE. Nucleation kinetics during homoepitaxial growth of TiN(001) by reactive magnetron sputtering Physical Review B - Condensed Matter and Materials Physics. 70: 035413-1-035413-8. DOI: 10.1103/Physrevb.70.035413  0.399
2004 Seo H, Lee T, Wen JG, Petrov I, Greene JE, Gall D. Growth and physical properties of epitaxial HfN layers on MgO(001) Journal of Applied Physics. 96: 878-884. DOI: 10.1063/1.1759783  0.444
2004 Lee T-, Kodambaka S, Wen JG, Twesten RD, Greene JE, Petrov I. Directed nanostructural evolution in Ti0.8Ce0.2N layers grown as a function of low-energy, high-flux ion irradiation Applied Physics Letters. 84: 2796-2798. DOI: 10.1063/1.1699468  0.525
2004 Shin C-, Rudenja S, Gall D, Hellgren N, Lee T-, Petrov I, Greene JE. Growth, surface morphology, and electrical resistivity of fully strained substoichiometric epitaxial TiNx (0.67⩽x<1.0) layers on MgO(001) Journal of Applied Physics. 95: 356-362. DOI: 10.1063/1.1629155  0.42
2004 Donchev T, Tsaneva V, Barber ZH, Nurgaliev T, Gravier L, Ansermet JP, Petrov I, Petrova V. Magnetic and electric properties of magnetron-sputtered YBCO/LSMO and LSMO/YBCO double layers Vacuum. 76: 261-264. DOI: 10.1016/J.Vacuum.2004.07.028  0.441
2004 Vitanov P, Harizanova A, Angelov C, Petrov I, Alexieva Z, Stefanov P. Structure and optical properties of (Al2O3) x(Tio)1-x thin films prepared by a sol-gel processing Vacuum. 76: 215-218. DOI: 10.1016/J.Vacuum.2004.07.017  0.42
2004 Kodambaka S, Khare SV, Petrova V, Vailionis A, Petrov I, Greene JE. Determination of absolute orientation-dependent TiN(0 0 1) and TiN(1 1 1) step energies Vacuum. 74: 345-351. DOI: 10.1016/J.Vacuum.2004.01.015  0.338
2004 Kodambaka S, Israeli N, Bareño J, Święch W, Ohmori K, Petrov I, Greene JE. Low-energy electron microscopy studies of interlayer mass transport kinetics on TiN(111) Surface Science. 560: 53-62. DOI: 10.1016/J.Susc.2004.05.005  0.348
2003 Abraham DP, Twesten RD, Balasubramanian M, Kropf J, Fischer D, McBreen J, Petrov I, Amine K. Microscopy and Spectroscopy of Lithium Nickel Oxide-Based Particles Used in High Power Lithium-Ion Cells Journal of the Electrochemical Society. 150: A1450. DOI: 10.1149/1.1613291  0.371
2003 Khabari A, Urban FK, Griffiths P, Petrov I, Kim YW, Bungay C. Nanoparticle beam formation and investigation of gold nanostructured films Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 21: 2313-2318. DOI: 10.1116/1.1615985  0.444
2003 Petrov I, Barna PB, Hultman L, Greene JE. Microstructural evolution during film growth Journal of Vacuum Science and Technology. 21: 117. DOI: 10.1116/1.1601610  0.461
2003 Broitman E, Hellgren N, Czigány Z, Twesten RD, Luning J, Petrov I, Hultman L, Holloway BC. Structural and mechanical properties of diamond-like carbon films deposited by direct current magnetron sputtering Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 21: 851-859. DOI: 10.1116/1.1575231  0.475
2003 Tian F, D’Arcy-Gall J, Lee T-, Sardela M, Gall D, Petrov I, Greene JE. Epitaxial Ti1-xWxN alloys grown on MgO(001) by ultrahigh vacuum reactive magnetron sputtering: Electronic properties and long-range cation ordering Journal of Vacuum Science and Technology. 21: 140-146. DOI: 10.1116/1.1525818  0.421
2003 Kodambaka S, Khare SV, Petrova V, Johnson DD, Petrov I, Greene JE. Absolute orientation-dependent anisotropic TiN(111) island step energies and stiffnesses from shape fluctuation analyses Physical Review B - Condensed Matter and Materials Physics. 67: 354091-354098. DOI: 10.1103/Physrevb.67.035409  0.303
2003 Lee T, Gall D, Shin C, Hellgren N, Petrov I, Greene JE. Growth and physical properties of epitaxial CeN layers on MgO(001) Journal of Applied Physics. 94: 921-927. DOI: 10.1063/1.1579113  0.483
2003 Shin C-, Gall D, Hellgren N, Patscheider J, Petrov I, Greene JE. Vacancy hardening in single-crystal TiNx(001) layers Journal of Applied Physics. 93: 6025-6028. DOI: 10.1063/1.1568521  0.372
2003 Gall D, Kodambaka S, Wall MA, Petrov I, Greene JE. Pathways of atomistic processes on TiN(001) and (111) surfaces during film growth: An ab initio study Journal of Applied Physics. 93: 9086-9094. DOI: 10.1063/1.1567797  0.405
2003 Åbom AE, Comini E, Sberveglieri G, Finnegan N, Petrov I, Hultman L, Eriksson M. Experimental evidence for a dissociation mechanism in NH3 detection with MIS field-effect devices Sensors and Actuators B-Chemical. 89: 1-8. DOI: 10.1016/S0925-4005(02)00400-8  0.406
2003 Ehiasarian AP, Munz W-, Hultman L, Helmersson U, Petrov I. High power pulsed magnetron sputtered CrNX films Surface & Coatings Technology. 163: 267-272. DOI: 10.1016/S0257-8972(02)00479-6  0.497
2003 Kodambaka S, Chopp DL, Petrov I, Greene JE. Coalescence kinetics of two-dimensional TiN islands on atomically smooth TiN(0 0 1) and TiN(1 1 1) terraces Surface Science. 540: L611-L616. DOI: 10.1016/S0039-6028(03)00846-X  0.337
2003 Kodambaka S, Petrova V, Vailionis A, Petrov I, Greene JE. In situ high-temperature scanning tunneling microscopy studies of two-dimensional TiN island coarsening kinetics on TiN (0 0 1) Surface Science. 526: 85-96. DOI: 10.1016/S0039-6028(02)02570-0  0.339
2003 Kodambaka S, Khare S, Petrova V, Vailionis A, Petrov I, Greene J. Erratum to: “Absolute orientation-dependent TiN(001) step energies from two-dimensional equilibrium island shape and coarsening measurements on epitaxial TiN(001) layers” [Surf. Sci. 513 (2002) 468–474] Surface Science. 523: 316. DOI: 10.1016/S0039-6028(02)02457-3  0.312
2003 Hovsepian PE, Kok YN, Ehiasarian AP, Erdemir A, Wen J-, Petrov I. Structure and tribological behaviour of nanoscale multilayer C/Cr coatings deposited by the combined steered cathodic arc/unbalanced magnetron sputtering technique Thin Solid Films. 447: 7-13. DOI: 10.1016/J.Tsf.2003.09.009  0.41
2003 Minor AM, Stach EA, Morris JW, Petrov I. In-situ nanoindentation of epitaxial TiN/MgO (001) in a transmission electron microscope Journal of Electronic Materials. 32: 1023-1027. DOI: 10.1007/S11664-003-0084-4  0.445
2002 Kodambaka S, Petrova V, Khare SV, Gall D, Rockett A, Petrov I, Greene JE. Size-dependent detachment-limited decay kinetics of two-dimensional TiN islands on TiN(111). Physical Review Letters. 89: 176102. PMID 12398688 DOI: 10.1103/Physrevlett.89.176102  0.318
2002 Kodambaka S, Petrova V, Khare SV, Johnson DD, Petrov I, Greene JE. Absolute TiN(111) step energies from analysis of anisotropic island shape fluctuations. Physical Review Letters. 88: 146101. PMID 11955162 DOI: 10.1103/Physrevlett.88.146101  0.301
2002 Shin C-, Kim Y-, Hellgren N, Gall D, Petrov I, Greene JE. Epitaxial growth of metastable δ-TaN layers on MgO(001) using low-energy, high-flux ion irradiation during ultrahigh vacuum reactive magnetron sputtering Journal of Vacuum Science and Technology. 20: 2007-2017. DOI: 10.1116/1.1513639  0.517
2002 Urban FK, Hosseini-Tehrani A, Griffiths P, Khabari A, Kim YW, Petrov I. Nanophase films deposited from a high-rate, nanoparticle beam Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 995-999. DOI: 10.1116/1.1481749  0.451
2002 Shin C-, Gall D, Kim Y-, Hellgren N, Petrov I, Greene JE. Development of preferred orientation in polycrystalline NaCl-structure δ-TaN layers grown by reactive magnetron sputtering: Role of low-energy ion surface interactions Journal of Applied Physics. 92: 5084-5093. DOI: 10.1063/1.1510558  0.459
2002 O'Sullivan PL, Baumann FH, Gilmer GH, Torre JD, Shin CS, Petrov I, Lee T. Continuum model of thin film deposition incorporating finite atomic length scales Journal of Applied Physics. 92: 3487-3494. DOI: 10.1063/1.1497465  0.382
2002 Gall D, Shin C-, Haasch RT, Petrov I, Greene JE. Band gap in epitaxial NaCl-structure CrN(001) layers Journal of Applied Physics. 91: 5882-5886. DOI: 10.1063/1.1466528  0.408
2002 Gall D, Shin C-, Spila T, Odén M, Senna MJH, Greene JE, Petrov I. Growth of single-crystal CrN on MgO(001): Effects of low-energy ion-irradiation on surface morphological evolution and physical properties Journal of Applied Physics. 91: 3589-3597. DOI: 10.1063/1.1446239  0.425
2002 Abraham D, Twesten R, Balasubramanian M, Petrov I, McBreen J, Amine K. Surface changes on LiNi0.8Co0.2O2 particles during testing of high-power lithium-ion cells Electrochemistry Communications. 4: 620-625. DOI: 10.1016/S1388-2481(02)00388-0  0.3
2002 Donchev T, Tsaneva V, Nurgaliev T, Gravier L, Ansermet JP, Petrov I, Petrova V, Matz VW, Groetzschel R, Pignard S, Vincent H. YBCO/LSMO and LSMO/YBCO double-layer deposition by off-axis magnetron sputtering and strain effects Vacuum. 69: 243-247. DOI: 10.1016/S0042-207X(02)00339-1  0.487
2002 Urban FK, Hosseini-Tehrani A, Khabari A, Griffiths P, Bungay C, Petrov I, Kim Y. Optical properties of nanophase films measured by variable-angle spectroscopic ellipsometry Thin Solid Films. 408: 211-217. DOI: 10.1016/S0040-6090(02)00082-2  0.442
2002 Shin C-, Kim Y-, Gall D, Greene JE, Petrov I. Phase composition and microstructure of polycrystalline and epitaxial TaNx layers grown on oxidized Si(001) and MgO(001) by reactive magnetron sputter deposition Thin Solid Films. 402: 172-182. DOI: 10.1016/S0040-6090(01)01618-2  0.462
2002 Kodambaka S, Khare SV, Petrova V, Vailionis A, Petrov I, Greene JE. Absolute orientation-dependent TiN(0 0 1) step energies from two-dimensional equilibrium island shape and coarsening measurements on epitaxial TiN(0 0 1) layers Surface Science. 513: 468-474. DOI: 10.1016/S0039-6028(02)01845-9  0.333
2001 Baumann FH, Chopp DL, Rubia TDdl, Gilmer GH, Greene JE, Huang H, Kodambaka S, O'Sullivan P, Petrov I. Multiscale Modeling of Thin-Film Deposition: Applications to Si Device Processing Mrs Bulletin. 26: 182-189. DOI: 10.1557/Mrs2001.40  0.372
2001 Hellgren N, Lin N, Broitman E, Serin V, Grillo SE, Twesten R, Petrov I, Colliex C, Hultman L, Sundgren J. Thermal stability of carbon nitride thin films Journal of Materials Research. 16: 3188-3201. DOI: 10.1557/Jmr.2001.0440  0.46
2001 Chun J, Desjardins P, Lavoie C, Petrov I, Cabral C, Greene JE. Interfacial reaction pathways and kinetics during annealing of 111-textured Al/TiN bilayers: A synchrotron x-ray diffraction and transmission electron microscopy study Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 19: 2207-2216. DOI: 10.1116/1.1379800  0.474
2001 Schönjahn C, Paritong H, Münz W-, Twesten RD, Petrov I. Influence of the interface composition on the corrosion behavior of unbalanced magnetron grown niobium coatings on steel Journal of Vacuum Science and Technology. 19: 1392-1398. DOI: 10.1116/1.1379319  0.378
2001 Schonjahn C, Ehiasarian A, Lewis DB, New R, Munz WD, Twesten RD, Petrov I. Optimization of in situ substrate surface treatment in a cathodic arc plasma: A study by TEM and plasma diagnostics Journal of Vacuum Science and Technology. 19: 1415-1420. DOI: 10.1116/1.1349726  0.392
2001 Chun J, Carlsson J, Desjardins P, Bergstrom D, Petrov I, Greene J, Lavoie C, Cabral C, Hultman L. Synchrotron x-ray diffraction and transmission electron microscopy studies of interfacial reaction paths and kinetics during annealing of fully-002-textured Al/TiN bilayers Journal of Vacuum Science and Technology. 19: 182-191. DOI: 10.1116/1.1322648  0.491
2001 Gall D, Städele M, Järrendahl K, Petrov I, Desjardins P, Haasch RT, Lee T, Greene JE. Electronic structure of ScN determined using optical spectroscopy, photoemission, andab initiocalculations Physical Review B. 63. DOI: 10.1103/Physrevb.63.125119  0.325
2001 D’Arcy-Gall J, Gall D, Petrov I, Desjardins P, Greene JE. Quantitative C lattice site distributions in epitaxial Ge1−yCy/Ge(001) layers Journal of Applied Physics. 90: 3910-3918. DOI: 10.1063/1.1402137  0.334
2001 Shin C-, Gall D, Kim Y-, Desjardins P, Petrov I, Greene JE, Odén M, Hultman L. Epitaxial NaCl structure d-TaNx(001): Electronic transport properties, elastic modulus, and hardness versus N/Ta ratio Journal of Applied Physics. 90: 2879-2885. DOI: 10.1063/1.1391214  0.394
2001 Chun J, Desjardins P, Lavoie C, Shin C, Cabral C, Petrov I, Greene JE. Interfacial reactions in epitaxial Al/TiN(111) model diffusion barriers: Formation of an impervious self-limited wurtzite-structure AIN(0001) blocking layer Journal of Applied Physics. 89: 7841-7845. DOI: 10.1063/1.1372162  0.442
2001 Williamson MJ, Dunn DN, Hull R, Kodambaka S, Petrov I, Greene JE. Evolution of nanoscale texture in ultrathin TiN films Applied Physics Letters. 78: 2223-2225. DOI: 10.1063/1.1360235  0.447
2001 Gall D, Petrov I, Greene JE. Epitaxial Sc1−xTixN(001): Optical and electronic transport properties Journal of Applied Physics. 89: 401-409. DOI: 10.1063/1.1329348  0.382
2001 Kodambaka S, Petrova V, Vailionis A, Desjardins P, Cahill D, Petrov I, Greene J. TiN(001) and TiN(111) island coarsening kinetics: in-situ scanning tunneling microscopy studies Thin Solid Films. 392: 164-168. DOI: 10.1016/S0040-6090(01)01022-7  0.337
2001 Chun J, Desjardins P, Petrov I, Greene J, Lavoie C, Cabral C. Interfacial reaction pathways and kinetics during annealing of epitaxial Al/TiN(001) model diffusion barrier systems Thin Solid Films. 391: 69-80. DOI: 10.1016/S0040-6090(01)00938-5  0.408
2000 Goindi HS, Shin CS, Frederick M, Shusterman Y, Kim H, Petrov I, Ramanath G. Electromigration in Epitaxial Copper Lines Mrs Proceedings. 648. DOI: 10.1557/Proc-648-P11.37  0.326
2000 Schönjahn C, Lewis DB, MW-, Petrov I. Shortlisted substrate ion etching in combined steered cathodic arc–ubm deposition system: effects on interface architecture, adhesion, and tool performance Surface Engineering. 16: 176-180. DOI: 10.1179/026708400101516973  0.435
2000 Ramanath G, Greene JE, Petrov I, Baker JE, Allen LH, Gillen G. Channeling-induced asymmetric distortion of depth profiles from polycrystalline-TiN/Ti/TiN(001) trilayers during secondary ion mass spectrometry Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18: 1369-1374. DOI: 10.1116/1.591387  0.336
2000 Schönjahn C, Donohue LA, Lewis DB, Münz W-, Twesten RD, Petrov I. Enhanced adhesion through local epitaxy of transition-metal nitride coatings on ferritic steel promoted by metal ion etching in a combined cathodic arc/unbalanced magnetron deposition system Journal of Vacuum Science and Technology. 18: 1718-1723. DOI: 10.1116/1.582414  0.469
2000 Macák K, Kouznetsov V, Schneider J, Helmersson U, Petrov I. Ionized sputter deposition using an extremely high plasma density pulsed magnetron discharge Journal of Vacuum Science and Technology. 18: 1533-1537. DOI: 10.1116/1.582380  0.317
2000 Finnegan N, Lee T-, Haasch RT, Greene JE, Petrov I. Epitaxial VN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar+ Sputter Etching Surface Science Spectra. 7: 213-220. DOI: 10.1116/1.1367616  0.497
2000 Haasch RT, Lee TY, Gall D, Greene JE, Petrov I. Epitaxial VN(001) Grown and Analyzed In situ by XPS and UPS. II. Analysis of Ar+ Sputter Etched Layers Surface Science Spectra. 7: 178-184. DOI: 10.1116/1.1367599  0.498
2000 Haasch RT, Lee TY, Gall D, Greene JE, Petrov I. Epitaxial CrN(001) Grown and Analyzed In situ by XPS and UPS. I. Analysis of As-deposited Layers Surface Science Spectra. 7: 221-232. DOI: 10.1116/1.1367598  0.478
2000 Gall D, Haasch RT, Finnegan N, Lee T-, Shin C-, Sammann E, Greene JE, Petrov I. In situ X-ray Photoelectron, Ultraviolet Photoelectron, and Auger Electron Spectroscopy Spectra from First-Row Transition-Metal Nitrides: ScN, TiN, VN, and CrN Surface Science Spectra. 7: 167-168. DOI: 10.1116/1.1360984  0.432
2000 Finnegan N, Haasch RT, Gall D, Kodambaka S, Greene JE, Petrov I. A Comparison of Auger Electron Spectra from Stoichiometric Epitaxial TiN(001) After (1) UHV Cleaving and (2) Ar+ Sputter Etching Surface Science Spectra. 7: 93-100. DOI: 10.1116/1.1288178  0.42
2000 D’Arcy-Gall J, Gall D, Desjardins P, Petrov I, Greene JE. Role of fast sputtered particles during sputter deposition: Growth of epitaxialGe0.99C0.01/Ge(001) Physical Review B. 62: 11203-11208. DOI: 10.1103/Physrevb.62.11203  0.386
2000 Karr BW, Cahill DG, Petrov I, Greene JE. Effects of high-flux low-energy ion bombardment on the low-temperature growth morphology of TiN(001) epitaxial layers Physical Review B - Condensed Matter and Materials Physics. 61: 16137-16143. DOI: 10.1103/Physrevb.61.16137  0.435
2000 D’Arcy-Gall J, Desjardins P, Petrov I, Greene JE, Paultre J, Masut RA, Gujrathi SC, Roorda S. Epitaxial metastable Ge1−yCy (y⩽0.02) alloys grown on Ge(001) from hyperthermal beams: C incorporation and lattice sites Journal of Applied Physics. 88: 96-104. DOI: 10.1063/1.373629  0.408
2000 Madsen LD, Svedberg EB, Bergstrom DB, Petrov I, Greene JE. Texture of Al thin films deposited by magnetron sputtering onto epitaxial W(001) Journal of Applied Physics. 87: 168-171. DOI: 10.1063/1.371839  0.447
2000 Kodambaka S, Petrova V, Vailionis A, Desjardins P, Cahill DG, Petrov I, Greene JE. In-situ high-temperature scanning-tunneling-microscopy studies of two-dimensional island-decay kinetics on atomically smooth TiN(001) Surface Review and Letters. 7: 589-593. DOI: 10.1016/S0218-625X(00)00081-6  0.345
1999 Gall D, Petrov I, Desjardins P, Greene JE. Microstructural evolution and Poisson ratio of epitaxial ScN grown on TiN(001)/MgO(001) by ultrahigh vacuum reactive magnetron sputter deposition Journal of Applied Physics. 86: 5524-5529. DOI: 10.1063/1.371555  0.508
1999 Chun J-, Petrov I, Greene JE. Dense fully 111-textured TiN diffusion barriers: Enhanced lifetime through microstructure control during layer growth Journal of Applied Physics. 86: 3633-3641. DOI: 10.1063/1.371271  0.487
1999 Shin C, Gall D, Desjardins P, Vailionis A, Kim H, Petrov I, Greene JE, Odén M. Growth and physical properties of epitaxial metastable cubic TaN(001) Applied Physics Letters. 75: 3808-3810. DOI: 10.1063/1.125463  0.465
1999 Schneider JM, Anders A, Hjörvarsson B, Petrov I, Macák K, Helmersson U, Sundgren J. Hydrogen uptake in alumina thin films synthesized from an aluminum plasma stream in an oxygen ambient Applied Physics Letters. 74: 200-202. DOI: 10.1063/1.123292  0.413
1999 Kouznetsov V, Macák K, Schneider JM, Helmersson U, Petrov I. A novel pulsed magnetron sputter technique utilizing very high target power densities Surface & Coatings Technology. 122: 290-293. DOI: 10.1016/S0257-8972(99)00292-3  0.372
1998 Smith IJ, Münz WD, Donohue LA, Petrov I, Greene JE. IMPROVED Ti1–xAlxN PVD COATINGS FOR DRY HIGH SPEED CUTTING OPERATIONS Surface Engineering. 14: 37-42. DOI: 10.1179/Sur.1998.14.1.37  0.361
1998 Gall D, Petrov I, Madsen LD, Sundgren J-, Greene JE. Microstructure and electronic properties of the refractory semiconductor ScN grown on MgO(001) by ultra-high-vacuum reactive magnetron sputter deposition Journal of Vacuum Science and Technology. 16: 2411-2417. DOI: 10.1116/1.581360  0.506
1998 Gall D, Petrov I, Hellgren N, Hultman L, Sundgren JE, Greene JE. Growth of poly- and single-crystal ScN on MgO(001): Role of low-energy N2+ irradiation in determining texture, microstructure evolution, and mechanical properties Journal of Applied Physics. 84: 6034-6041. DOI: 10.1063/1.368913  0.511
1998 Van Nostrand JE, Cahill DG, Petrov I, Greene JE. Morphology and microstructure of tensile-strained SiGe(001) thin epitaxial films Journal of Applied Physics. 83: 1096-1102. DOI: 10.1063/1.366799  0.488
1998 Gujrathi SC, Roorda S, D'Arcy JG, Pflueger RJ, Desjardins P, Petrov I, Greene JE. Quantitative compositional depth profiling of Si1−x−yGexCy thin films by simultaneous elastic recoil detection and Rutherford backscattering spectrometry Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 654-660. DOI: 10.1016/S0168-583X(97)00881-1  0.436
1997 Bergstrom DB, Petrov I, Greene JE. Al/TixW1−x metal/diffusion-barrier bilayers: Interfacial reaction pathways and kinetics during annealing Journal of Applied Physics. 82: 2312-2322. DOI: 10.1063/1.366039  0.409
1997 Bergstrom DB, Petrov I, Allen LH, Greene JE. Aluminide formation in polycrystalline Al/W metal/barrier thin-film bilayers: Reaction paths and kinetics Journal of Applied Physics. 82: 201-209. DOI: 10.1063/1.365798  0.475
1997 Karr BW, Petrov I, Cahill DG, Greene JE. Morphology of epitaxial TiN(001) grown by magnetron sputtering Applied Physics Letters. 70: 1703-1705. DOI: 10.1063/1.118675  0.468
1997 Karr BW, Petrov I, Desjardins P, Cahill DG, Greene JE. In situ scanning tunneling microscopy studies of the evolution of surface morphology and microstructure in epitaxial TiN(001) grown by ultra-high-vacuum reactive magnetron sputtering Surface and Coatings Technology. 94: 403-408. DOI: 10.1016/S0257-8972(97)00444-1  0.53
1997 Donohue LA, Smith IJ, Münz W-, Petrov I, Greene JE. Microstructure and oxidation-resistance of Ti1 − x − y −zAlxCryYzN layers grown by combined steered-arc/unbalanced-magnetron-sputter deposition Surface & Coatings Technology. 226-231. DOI: 10.1016/S0257-8972(97)00249-1  0.421
1997 Donohue LA, Münz W-, Lewis DB, Cawley J, Hurkmans T, Trinh T, Petrov I, Greene IE. Large-scale fabrication of hard superlattice thin films by combined steered arc evaporation and unbalanced magnetron sputtering Surface & Coatings Technology. 93: 69-87. DOI: 10.1016/S0257-8972(97)00028-5  0.444
1997 Ivanov I, Ljungcrantz H, Hakansson G, Petrov I, Sundgren J-. Ion energy distributions in reactive arc evaporation discharges used for deposition of TiN films Surface & Coatings Technology. 92: 150-156. DOI: 10.1016/S0257-8972(96)03152-0  0.344
1997 Petrov I, Losbichler P, Bergstrom D, Greene JE, Münz W-, Hurkmans T, Trinh T. Ion-assisted growth of Ti1−xAlxN/Ti1−yNbyN multilayers by combined cathodic-arc/magnetron-sputter deposition Thin Solid Films. 302: 179-192. DOI: 10.1016/S0040-6090(96)09524-7  0.488
1996 Kim YW, Petrov I, Greene JE, Rossnagel SM. Development of 111 texture in Al films grown on SiO2/Si(001) by ultrahigh‐vacuum primary‐ion deposition Journal of Vacuum Science and Technology. 14: 346-351. DOI: 10.1116/1.579899  0.489
1996 Karr BW, Kim YW, Petrov I, Bergstrom DB, Cahill DG, Greene JE, Madsen LD, Sundgren J. Morphology and microstructure of epitaxial Cu(001) films grown by primary ion deposition on Si and Ge substrates Journal of Applied Physics. 80: 6699-6705. DOI: 10.1063/1.363795  0.467
1996 Salagean EE, Lewis DB, Brooks JS, Münz W-, Petrov I, Greene JE. Combined steered arc-unbalanced magnetron grown niobium coatings for decorative and corrosion resistance applications Surface & Coatings Technology. 82: 57-64. DOI: 10.1016/0257-8972(95)02639-8  0.366
1995 Bergstrom DB, Petrov I, Allen LH, Greene JE. Reaction paths and kinetics of aluminide formation in Al/epitaxial-W(001) model diffusion barrier systems Journal of Applied Physics. 78: 194-203. DOI: 10.1063/1.360651  0.423
1995 Hultman L, Sundgren J‐, Greene JE, Bergstrom DB, Petrov I. High‐flux low‐energy (≂20 eV) N+2 ion irradiation during TiN deposition by reactive magnetron sputtering: Effects on microstructure and preferred orientation Journal of Applied Physics. 78: 5395-5403. DOI: 10.1063/1.359720  0.521
1995 Bergstrom DB, Tian F, Petrov I, Moser J, Greene JE. Origin of compositional variations in sputter‐deposited TixW1−x diffusion barrier layers Applied Physics Letters. 67: 3102-3104. DOI: 10.1063/1.114878  0.488
1995 Greene JE, Sundgren J‐, Hultman L, Petrov I, Bergstrom DB. Development of preferred orientation in polycrystalline TiN layers grown by ultrahigh vacuum reactive magnetron sputtering Applied Physics Letters. 67: 2928-2930. DOI: 10.1063/1.114845  0.518
1994 Kim Y‐, Moser J, Petrov I, Greene JE, Rossnagel SM. Directed sputter deposition of AlCu: Film microstructure and microchemistry Journal of Vacuum Science and Technology. 12: 3169-3175. DOI: 10.1116/1.579233  0.514
1994 Petrov I, Myers A, Greene JE, Abelson JR. Mass and energy resolved detection of ions and neutral sputtered species incident at the substrate during reactive magnetron sputtering of Ti in mixed Ar+N2 mixtures Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 12: 2846-2854. DOI: 10.1116/1.578955  0.425
1994 Ivanov I, Kazansky P, Hultman L, Petrov I, Sundgren J‐. Influence of an external axial magnetic field on the plasma characteristics and deposition conditions during direct current planar magnetron sputtering Journal of Vacuum Science and Technology. 12: 314-320. DOI: 10.1116/1.578874  0.339
1994 Moser JH, Tian F, Haller O, Bergstrom DB, Petrov I, Greene JE, Wiemer C. Single-phase polycrystalline Ti1−xWxN alloys (0⩽x⩽0.7) grown by UHV reactive magnetron sputtering: microstructure and physical properties Thin Solid Films. 253: 445-450. DOI: 10.1016/0040-6090(94)90364-6  0.48
1994 Statev S, Ivanov I, Petrov I, Carlsson J, Orlinov V. Influence of the plasma kinetics on the Si/C ratio of a-SixC1−x:H thin films deposited by reactive magnetron sputtering of a Si target in Ar+CH4 gas mixtures Contributions to Plasma Physics. 34: 39-49. DOI: 10.1002/Ctpp.2150340106  0.435
1993 Petrov I, Ivanov I, Orlinov V, Sundgren J‐. Comparison of magnetron sputter deposition conditions in neon, argon, krypton, and xenon discharges Journal of Vacuum Science and Technology. 11: 2733-2741. DOI: 10.1116/1.578634  0.362
1993 Adibi F, Petrov I, Greene JE, Wahlström U, Sundgren J‐. Design and characterization of a compact two‐target ultrahigh vacuum magnetron sputter deposition system: Application to the growth of epitaxial Ti1−xAlxN alloys and TiN/Ti1−xAlxN superlattices Journal of Vacuum Science and Technology. 11: 136-142. DOI: 10.1116/1.578279  0.475
1993 Petrov I, Mojab E, Adibi F, Greene JE, Hultman L, Sundgren J‐. Interfacial reactions in epitaxial Al/Ti1−xAlxN (0≤x≤0.2) model diffusion‐barrier structures Journal of Vacuum Science and Technology. 11: 11-17. DOI: 10.1116/1.578277  0.409
1993 Adibi F, Petrov I, Greene JE, Hultman L, Sundgren J‐. Effects of high‐flux low‐energy (20–100 eV) ion irradiation during deposition on the microstructure and preferred orientation of Ti0.5Al0.5N alloys grown by ultra‐high‐vacuum reactive magnetron sputtering Journal of Applied Physics. 73: 8580-8589. DOI: 10.1063/1.353388  0.517
1993 Petrov I, Adibi F, Greene JE, Hultman L, Sundgren J‐. Average energy deposited per atom : a universal parameter for describing ion-assisted film growth ? Applied Physics Letters. 63: 36-38. DOI: 10.1063/1.109742  0.501
1993 Sproul WD, Rudnik PJ, Legg KO, Münz W-, Petrov I, Greene JE. Reactive sputtering in the ABSTM system Surface & Coatings Technology. 56: 179-182. DOI: 10.1016/0257-8972(93)90023-H  0.392
1993 Wahlström U, Hultman L, Sundgren J-, Adibi F, Petrov I, Greene JE. Crystal growth and microstructure of polycrystalline Ti1−xAlxN alloy films deposited by ultra-high-vacuum dual-target magnetron sputtering Thin Solid Films. 235: 62-70. DOI: 10.1016/0040-6090(93)90244-J  0.49
1993 Guinn KV, Donnelly VM, Gross ME, Baiocchi FA, Petrov I, Greene JE. Decomposition of hexafluoroacetylacetonate Cu(I) vinyltrimethylsilane on, and diffusion of Cu into single crystal and polycrystalline titanium nitride Surface Science. 295: 219-229. DOI: 10.1016/0039-6028(93)90198-S  0.325
1992 Guinn KV, Donnelly VM, Gross ME, Baiocchi FA, Petrov I, Greene JE. Copper CVD Reactions of Cu(I)(hfae)(vtms) Adsorbed on TiN Mrs Proceedings. 282: 379. DOI: 10.1557/Proc-282-379  0.307
1992 Sundgren J, Hultman L, Håkansson G, Birch J, Petrov I. Formation of Defects During Ion-Assisted Growth of Thin Films from the Vapor Phase Mrs Proceedings. 268. DOI: 10.1557/Proc-268-71  0.438
1992 Petrov I, Hultman L, Sundgren J‐, Greene JE. Polycrystalline TiN films deposited by reactive bias magnetron sputtering: Effects of ion bombardment on resputtering rates, film composition, and microstructure Journal of Vacuum Science and Technology. 10: 265-272. DOI: 10.1116/1.578074  0.522
1992 Petrov I, Adibi F, Greene JE, Sproul WD, Münz W‐. Use of an externally applied axial magnetic field to control ion/neutral flux ratios incident at the substrate during magnetron sputter deposition Journal of Vacuum Science and Technology. 10: 3283-3287. DOI: 10.1116/1.577812  0.375
1992 Petrov I, Mojab E, Powell RC, Greene JE, Hultman L, Sundgren J‐. Synthesis of metastable epitaxial zinc‐blende‐structure AlN by solid‐state reaction Applied Physics Letters. 60: 2491-2493. DOI: 10.1063/1.106943  0.384
1992 Hultman L, Benhenda S, Radnoczi G, Sundgren J-, Greene JE, Petrov I. Interfacial reactions in single-crystal-TiN (100)/Al/polycrystalline-TiN multilayer thin films Thin Solid Films. 215: 152-161. DOI: 10.1016/0040-6090(92)90430-J  0.431
1992 Kimura H, Petrov I, Adibi F, Greene JE. Growth and microstructure of epitaxial 45°-rotated bcc W layers on NaCl-structure MgO(001) substrates and TiN(001) buffer layers Journal of Crystal Growth. 123: 344-356. DOI: 10.1016/0022-0248(92)90594-9  0.503
1991 Hultman L, Münz W‐, Musil J, Kadlec S, Petrov I, Greene JE. Low‐energy (∼100 eV) ion irradiation during growth of TiN deposited by reactive magnetron sputtering: Effects of ion flux on film microstructure Journal of Vacuum Science and Technology. 9: 434-438. DOI: 10.1116/1.577428  0.5
1991 Adibi F, Petrov I, Hultman L, Wahlström U, Shimizu T, McIntyre D, Greene JE, Sundgren J‐. Defect structure and phase transitions in epitaxial metastable cubic Ti0.5Al0.5N alloys grown on MgO(001) by ultra‐high‐vacuum magnetron sputter deposition Journal of Applied Physics. 69: 6437-6450. DOI: 10.1063/1.348849  0.479
1991 Hultman L, Håkansson G, Wahlström U, Sundgren J-, Petrov I, Adibi F, Greene JE. Transmission electron microscopy studies of microstructural evolution, defect structure, and phase transitions in polycrystalline and epitaxial Ti1-xAlxN and TiN films grown by reactive magnetron sputter deposition Thin Solid Films. 205: 153-164. DOI: 10.1016/0040-6090(91)90297-B  0.491
1990 Håkansson G, Petrov I, Sundgren J‐. Growth of TaC thin films by reactive direct current magnetron sputtering: Composition and structure Journal of Vacuum Science and Technology. 8: 3769-3778. DOI: 10.1116/1.576492  0.434
1990 Rohde SL, Petrov I, Sproul WD, Barnett SA, Rudnik PJ, Graham ME. Effects of an unbalanced magnetron in a unique dual-cathode, high rate reactive sputtering system Thin Solid Films. 193: 117-126. DOI: 10.1016/S0040-6090(05)80019-7  0.42
1990 Petrov I, Ivanov I, Orlinov V, Kourtev J, Jelev J. Deposition of carbon films by bias magnetron sputtering in neon and argon Thin Solid Films. 185: 247-256. DOI: 10.1016/0040-6090(90)90089-V  0.464
1989 Selinder TI, Larsson G, Helmersson U, Rudner S, Petrov I. The dc magnetron sputter deposition process of YBa2Cu3Ox thin films Physica C-Superconductivity and Its Applications. 162: 599-600. DOI: 10.1016/0921-4534(89)91166-0  0.406
1989 Petrov I, Hultman L, Helmersson U, Sundgren J-, Greene JE. Microstructure modification of TiN by ion bombardment during reactive sputter deposition Thin Solid Films. 169: 299-314. DOI: 10.1016/0040-6090(89)90713-X  0.454
1989 Petrov I, Orlinov V, Ivanov I, Kourtev J, Jelev J. Effect of ion bombardment during growth on the electrical resistivity of magnetron-sputtered carbon films Thin Solid Films. 168: 239-248. DOI: 10.1016/0040-6090(89)90010-2  0.464
1988 Petrov I, Orlinov V, Ivanov I, Kourtev J. Influence of the Basic Process Parameters on the Ion/Atom Arrival Rate Ratio during Magnetron Sputter Deposition of Thin Carbon Films Contributions to Plasma Physics. 28: 265-273. DOI: 10.1002/Ctpp.2150280309  0.421
1988 Petrov I, Orlinov V, Ivanov I, Kourtev J. Electrostatic Probe Measurements in the Glow Discharge Plasma of a D. C. Magnetron Sputtering System Contributions to Plasma Physics. 28: 157-167. DOI: 10.1002/Ctpp.2150280207  0.361
1984 Petrov I, Orlinov V, Misiuk A. Highly oriented ZnO films obtained by d.c. reactive sputtering of a zinc target Thin Solid Films. 120: 55-67. DOI: 10.1016/0040-6090(84)90173-1  0.468
1983 Petrov I, Braun M, Fried T, Sätherblom HE. Atomic concentrations of binary compound thin films on elemental substrates determined by Rutherford backscattering techniques Journal of Applied Physics. 54: 1358-1364. DOI: 10.1063/1.332157  0.366
1982 Orlinov V, Mladenov G, Petrov I, Braun M, Emmoth B. Angular distribution and sputtering yield of Al and Al2O3 during 40 key argon ion bombardment Vacuum. 32: 747-752. DOI: 10.1016/0042-207X(82)93847-7  0.403
1978 Goranchev B, Orlinov V, Tsaneva V, Petrov I. Direct current reactive sputtering of aluminium Thin Solid Films. 52: 365-371. DOI: 10.1016/0040-6090(78)90179-7  0.379
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