Jung-Hoon Chun, Ph.D.
Affiliations: | 2006 | Stanford University, Palo Alto, CA |
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"Jung-Hoon Chun"Parents
Sign in to add mentor| Robert W. Dutton | grad student | 2006 | Stanford | |
| (ESD protection circuits for advanced CMOS technologies.) | ||||
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Publications
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| Lee CJ, Park JK, Seo HE, et al. (2020) Fully Differential Touch Screen Controller with Wide Input Dynamic Range for Thin Displays. Sensors (Basel, Switzerland). 20 |
| Jin X, Kwon K, Choi Y, et al. (2019) A Dual-loop Phase Locked Loop with Frequency to Voltage Converter Journal of Semiconductor Technology and Science. 19: 292-299 |
| Park J, Ko W, Kang D, et al. (2019) An Output Capacitor-Less Low-Dropout Regulator with 0–100 mA Wide Load Current Range Energies. 12: 211 |
| Kim J, Jang W, Lee Y, et al. (2019) Design and Analysis of a 12-b Current-Steering DAC in a 14-nm FinFET Technology for 2G/3G/4G Cellular Applications Ieee Transactions On Circuits and Systems I-Regular Papers. 66: 3723-3732 |
| Lee CJ, Park JK, Piao C, et al. (2018) Mutual Capacitive Sensing Touch Screen Controller for Ultrathin Display with Extended Signal Passband Using Negative Capacitance. Sensors (Basel, Switzerland). 18 |
| Kim SH, Shin H, Jeong Y, et al. (2018) A 12-Gb/s Stacked Dual-Channel Interface for CMOS Image Sensor Systems. Sensors (Basel, Switzerland). 18 |
| Saif H, Lee Y, Lee H, et al. (2018) A Wide Load Current and Voltage Range Switched Capacitor DC–DC Converter with Load Dependent Configurability for Dynamic Voltage Implementation in Miniature Sensors Energies. 11: 3092 |
| Jin J, Kim S, Jin X, et al. (2018) A 12.5-Gb/s Near-Ground Transceiver Employing a MaxEye Algorithm-Based Adaptation Technique Ieee Transactions On Very Large Scale Integration Systems. 26: 522-530 |
| Jin J, Jin X, Jung J, et al. (2018) A 0.75–3.0-Gb/s Dual-Mode Temperature-Tolerant Referenceless CDR With a Deadzone-Compensated Frequency Detector Ieee Journal of Solid-State Circuits. 53: 2994-3003 |
| Jung J, Kim I, Kim S, et al. (2018) A 1.08-nW/kHz 13.2-ppm/°C Self-Biased Timer Using Temperature-Insensitive Resistive Current Ieee Journal of Solid-State Circuits. 53: 2311-2318 |