King-ning Tu

Affiliations: 
1968-1993 Materials Science IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States 
 1993-2016 Materials Science & Engineering University of California, Los Angeles, Los Angeles, CA 
 2012- Materials and Electrical Engineering City University of Hong Kong, Kowloon, Hong Kong 
 2016- National Chiao Tung University, Taiwan 
Area:
3D IC packaging and joule heating, metal-silicon interfaces, electromigration, pb-free solder joints
Website:
https://www.ee.cityu.edu.hk/~kntu/
Google:
"King-ning Tu"
Bio:

http://www.seas.ucla.edu/ethinfilm/professor.html
https://www.ee.ucla.edu/king-ning-tu/
https://ui.adsabs.harvard.edu/abs/1968PhDT.........8T/abstract
DOI: 10.1016/0001-6160(67)90214-3

Parents

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David Turnbull grad student 1968 Harvard (Chemistry Tree)
 (Morphology and Kinetics of Cellular Precipitation)

Children

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Taekyeong Lee grad student 2001 UCLA
Peter S. Nam grad student 2001 UCLA
Woojin Choi grad student 2002 UCLA
Hua Gan grad student 2004 UCLA
Shengquan Ou grad student 2005 UCLA
Minyu Yan grad student 2005 UCLA
Annie T. Huang grad student 2006 UCLA
Fei Ren grad student 2006 UCLA
Jongook Suh grad student 2006 UCLA
Fan-Yi Ou Yang grad student 2007 UCLA
Kuo-Chang Lu grad student 2008 UCLA
Di Xu grad student 2009 UCLA
Hsin-Ping Chen grad student 2010 UCLA
Yi-Chia Chou grad student 2010 UCLA
Daechul Choi grad student 2011 UCLA
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Publications

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Chou YC, Chen LJ, Tu KN. (2022) Uphill Diffusion Induced Point Contact Reaction in Si Nanowires. Nano Letters
Li YJ, Tu KN, Chen C. (2020) Tensile Properties of <111>-Oriented Nanotwinned Cu with Different Columnar Grain Structures. Materials (Basel, Switzerland). 13
Li YJ, Hsu CW, Ting YH, et al. (2020) Deformation induced columnar grain rotation in nanotwinned metals Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing. 797: 140045
Thompson RD, Gupta D, Tu KN. (2019) Low-temperature diffusion and solubility of Ni in P-doped Czochralski-grown Si. Physical Review. B, Condensed Matter. 33: 2636-2641
Shen YA, Zhou S, Li J, et al. (2019) Thermomigration induced microstructure and property changes in Sn-58Bi solders Materials & Design. 166: 107619
Juang JY, Lu CL, Chen KJ, et al. (2018) Copper-to-copper direct bonding on highly (111)-oriented nanotwinned copper in no-vacuum ambient. Scientific Reports. 8: 13910
Tseng CH, Tu KN, Chen C. (2018) Comparison of oxidation in uni-directionally and randomly oriented Cu films for low temperature Cu-to-Cu direct bonding. Scientific Reports. 8: 10671
Chang YW, Cheng Y, Helfen L, et al. (2017) Electromigration Mechanism of Failure in Flip-Chip Solder Joints Based on Discrete Void Formation. Scientific Reports. 7: 17950
Annuar S, Mahmoodian R, Hamdi M, et al. (2017) Intermetallic compounds in 3D integrated circuits technology: a brief review. Science and Technology of Advanced Materials. 18: 693-703
Chu DT, Chu Y, Lin J, et al. (2017) Growth competition between layer-type and porous-type Cu 3 Sn in microbumps Microelectronics Reliability. 79: 32-37
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