Daniel D. Lofgreen, Ph.D.

Affiliations: 
2004 University of California, Santa Barbara, Santa Barbara, CA, United States 
Area:
Electronics & Photonics
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"Daniel Lofgreen"

Parents

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Larry Coldren grad student 2004 UC Santa Barbara
 (Investigation of selective quantum well intermixing in vertical cavity lasers.)
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Publications

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Benson JD, Bubulac LO, Jaime-Vasquez M, et al. (2015) As-Received CdZnTe Substrate Contamination Journal of Electronic Materials
Benson JD, Bubulac LO, Smith PJ, et al. (2014) Impact of tellurium precipitates in CdZnTe substrates on MBE HgCdTe deposition Journal of Electronic Materials. 43: 3993-3998
Vilela MF, Olsson KR, Rybnicek K, et al. (2014) Higher dislocation density of arsenic-doped HgCdTe material Journal of Electronic Materials. 43: 3018-3024
Reddy M, Radford WA, Lofgreen DD, et al. (2014) Study of morphological defects on dual-band HgCdTe on CdZnTe Journal of Electronic Materials. 43: 2991-2997
Vilela MF, Olsson KR, Norton EM, et al. (2013) High-performance M/LWIR Dual-Band HgCdTe/Si focal-plane arrays Journal of Electronic Materials. 42: 3231-3238
Benson JD, Bubulac LO, Lennon CM, et al. (2013) Impurity gettering in (112)B HgCdTe/CdTe/alternate substrates Journal of Electronic Materials. 42: 3217-3223
Reddy M, Lofgreen DD, Jones KA, et al. (2013) Cross-sectional study of macrodefects in MBE dual-band HgCdTe on CdZnTe Journal of Electronic Materials. 42: 3114-3118
Reddy M, Wilde J, Peterson JM, et al. (2012) Study of macrodefects in MBE-grown HgCdTe epitaxial layers using focused ion beam milling Journal of Electronic Materials. 41: 2957-2964
Vilela MF, Pribil GK, Olsson KR, et al. (2012) HgCdTe molecular beam epitaxy growth temperature calibration using spectroscopic ellipsometry Journal of Electronic Materials. 41: 2937-2942
Benson JD, Farrell S, Brill G, et al. (2011) Dislocation analysis in (112)B HgCdTe/CdTe/Si Journal of Electronic Materials. 40: 1847-1853
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