Christopher J. Tourek, Ph.D.
Affiliations: | 2012 | Mechanical Engineering | Iowa State University, Ames, IA, United States |
Area:
Mechanical Engineering, Materials Science EngineeringGoogle:
"Christopher Tourek"Parents
Sign in to add mentor| Sriram Sundararajan | grad student | 2012 | Iowa State | |
| (Application of atom probe tomography to the investigation of atomic force microscope tips and interfacial phenomena.) | ||||
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Publications
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| Hu X, Tourek CJ, Ye Z, et al. (2014) Structural and chemical evolution of the near-apex region of an atomic force microscope tip subject to sliding Tribology Letters. 53: 181-187 |
| Tourek C, Sundararajan S. (2012) Detection and analysis of the native oxide layer and material transfer on the near apex region of atomic force microscope tips using atom probe tomography Microscopy and Microanalysis. 18: 914-915 |
| Tourek C, Sundararajan S. (2011) Characterization of the Chemistry and Structure of Material Transfer on AFM Tips Resulting from Contact and Sliding Experiments Microscopy and Microanalysis. 17: 748-749 |
| Chen X, Tourek C, Wang X, et al. (2011) Analysis of Laser Influence on Field Enhancement and Heating of the Specimen in Pulsed Laser Atom Probe Tomography Microscopy and Microanalysis. 17: 742-743 |
| Tourek CJ, Sundararajan S. (2010) An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact. The Review of Scientific Instruments. 81: 073711 |
| Tourek CJ, Sundararajan S. (2010) Atom scale characterization of the near apex region of an atomic force microscope tip. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 16: 636-42 |
| Tourek CJ, Sundararajan S. (2009) Study of atomic force microscopy probes using a local electrode atom probe microscope Microscopy and Microanalysis. 15: 290-291 |