Jon M. Pikal

Affiliations: 
Electrical & Computer Engineering University of Wyoming, Laramie, WY, United States 
Area:
Electronics and Electrical Engineering, Condensed Matter Physics
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"Jon Pikal"
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Publications

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Yakami BR, Poudyal U, Nandyala SR, et al. (2016) Steady state and time resolved optical characterization studies of Zn2SnO4 nanowires for solar cell applications Journal of Applied Physics. 120: 163101
Horoz S, Yakami B, Poudyal U, et al. (2016) Controlled synthesis of Eu2+ and Eu3+ doped ZnS quantum dots and their photovoltaic and magnetic properties Aip Advances. 6
Horoz S, Dai Q, Maloney FS, et al. (2015) Absorption induced by Mn doping of ZnS for improved sensitized quantum-dot solar cells Physical Review Applied. 3
Singh U, Dikshit AA, Pikal JM. (2013) Rate equation modeling of current injection efficiency in 1.3-μm InAs-InGaAs quantum dot lasers Proceedings of Spie - the International Society For Optical Engineering. 8619
Singh U, Pikal JM. (2012) High bandwidth constant current modulation circuit for carrier lifetime measurements in semiconductor lasers Proceedings of Spie - the International Society For Optical Engineering. 8259
Xu L, Patel D, Menoni CS, et al. (2012) Carrier recombination dynamics investigations of strain-compensated InGaAsN quantum wells Ieee Photonics Journal. 4: 2382-2389
Horoz S, Lu L, Dai Q, et al. (2012) CdSe quantum dots synthesized by laser ablation in water and their photovoltaic applications Applied Physics Letters. 101
Dikshit AA, Vangapally V, Pikal JM. (2006) Carrier lifetime and recombination in 1.3 μm P-doped InAs qauntum-dot lasers Proceedings of Spie - the International Society For Optical Engineering. 6133
Dikshit AA, Vangapally V, Pikal JM. (2005) Carrier lifetime in 1.3 μm InAs quantam-dot lasers using small-signal modulation technique Proceedings of Spie - the International Society For Optical Engineering. 6017
Anton O, Menoni CS, Yeh JY, et al. (2005) Increased monomolecular recombination in MOCVD grown 1.3-μm InGaAsN-GaAsP-GaAs QW lasers from carrier lifetime measurements Ieee Photonics Technology Letters. 17: 953-955
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