Sergio D. Cabrera

Engineering University of Texas at El Paso, El Paso, TX, United States 
Electronics and Electrical Engineering
"Sergio Cabrera"
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Cabrera SD, Rosiles JG, Brito AE. (2007) Affine scaling transformation algorithms for harmonic retrieval in a compressive sampling framework Proceedings of Spie - the International Society For Optical Engineering. 6701
Lucero A, Cabrera SD, Vidal E. (2007) On the use of JPEG 2000 to achieve minimum L-infinity error when specifying a compression ratio Proceedings - International Conference On Image Processing, Icip. 2
Lucero A, Cabrera SD, Vidai E. (2006) Residual coding with a JPEG2000 framework for controlling L-infinity error applied to ultraspectral sounder data Proceedings of Spie - the International Society For Optical Engineering. 6300
Cabrera SD, Malladi S, Mulpuri R, et al. (2004) Adaptive refinement in maximally sparse harmonic signal retrieval 2004 Ieee 11th Digital Signal Processing Workshop and 2nd Ieee Signal Processing Education Workshop. 231-235
Aguirre A, Cabrera SD, Lucero A, et al. (2004) Compression of three-dimensional medical image data based on JPEG 2000 Proceedings of the Ieee Symposium On Computer-Based Medical Systems. 17: 116-121
Brito AE, Chan SH, Cabrera SD. (2003) SAR image superresolution via 2-D adaptive extrapolation Multidimensional Systems and Signal Processing. 14: 83-104
Lucero A, Cabrera SD, Aguirre A, et al. (2003) Compressing Three-Dimensional GRIB Meteorological Data Using KLT and JPEG 2000 International Geoscience and Remote Sensing Symposium (Igarss). 3: 1836-1838
Cabrera SD, Boonsri T, Brito AE. (2002) Principal component separation in sparse signal recovery for harmonic retrieval Proceedings of the Ieee Sensor Array and Multichannel Signal Processing Workshop. 2002: 249-253
Brito AE, Cabrera SD, Villalobos C. (2001) Optimal sparse representation algorithms for harmonic retrieval Conference Record of the Asilomar Conference On Signals, Systems and Computers. 2: 1407-1411
Whittenberger E, Brito AE, Cabrera SD. (2000) Applying the eigenfaces and Fisherfaces methods to circuit-board inspection Optical Engineering. 39: 3154-3164
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