Jiseok Kim, Ph.D.
Affiliations: | 2011 | Electrical & Computer Engineering | University of Massachusetts, Amherst, Amherst, MA |
Area:
Electronics and Electrical Engineering, General Physics, Quantum PhysicsGoogle:
"Jiseok Kim"Parents
Sign in to add mentorMassimo Fischetti | grad student | 2011 | U Mass Amherst | |
(Band structure calculations of strained semiconductors using empirical pseudopotential theory.) |
BETA: Related publications
See more...
Publications
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
Fischetti MV, Kim J, Narayanan S, et al. (2013) Pseudopotential-based studies of electron transport in graphene and graphene nanoribbons. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 25: 473202 |
Fischetti MV, Aboud SJ, Ong ZY, et al. (2013) Pseudopotential-based study of electron transport in low-dimensionality nanostructures Ecs Transactions. 58: 229-234 |
Kim J, Fischetti MV, Aboud S. (2012) Structural, electronic, and transport properties of silicane nanoribbons Physical Review B. 86 |
Kim J, Krishnan SA, Narayanan S, et al. (2012) Thickness and temperature dependence of the leakage current in hafnium-based Si SOI MOSFETs Microelectronics Reliability. 52: 2907-2913 |
Kim J, Fischetti MV. (2011) Empirical pseudopotential calculations of the band structure and ballistic conductance of strained [001], [110], and [111] silicon nanowires Journal of Applied Physics. 110: 033716 |
Kim J, Fischetti MV. (2010) Electronic band structure calculations for biaxially strained Si, Ge, and III–V semiconductors Journal of Applied Physics. 108: 013710 |
Fischetti MV, O'Regan TP, Narayanan S, et al. (2007) Theoretical study of some physical aspects of electronic transport in nMOSFETs at the 10-nm gate-length Ieee Transactions On Electron Devices. 54: 2116-2136 |
Zhang Y, Kim J, Fischetti MV. (2007) Self-consistent calculation for valence subband structure and hole mobility in p-channel inversion layers Journal of Computational Electronics. 7: 176-180 |