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|Yarimbiyik AE, Schafft HA, Allen RA, et al. (2006) Modeling and simulation of resistivity of nanometer scale copper Microelectronics Reliability. 46: 1050-1057|
|Yarimbiyik AE, Schafft HA, Allen RA, et al. (2005) Resistivity of nanometer-scale films and interconnects: Model and simulation Ieee International Integrated Reliability Workshop Final Report. 2005: 139-140|