Sule Ozev, Ph.D.

Affiliations: 
2002 University of California, San Diego, La Jolla, CA 
 2008- Electrical, Computer and Energy Engineering Arizona State University, Tempe, AZ, United States 
Area:
Electronics and Electrical Engineering
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"Sule Ozev"

Parents

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Alex Orailoglu grad student 2002 UCSD
 (High level test approaches for mixed -signal systems.)
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Publications

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Chang D, Kitchen JN, Kiaei S, et al. (2020) In-Field Recovery of RF Circuits from Wearout Based Performance Degradation Ieee Transactions On Emerging Topics in Computing. 8: 442-452
Erol OE, Ozev S. (2020) A Reconfigurable 0.1–10 MHz DT Passive Dynamic Zoom ADC for Cellular Receivers Ieee Transactions On Circuits and Systems. 67: 2216-2228
Bhat G, Gao H, Mandal SK, et al. (2020) Determining Mechanical Stress Testing Parameters for FHE Designs with Low Computational Overhead Ieee Design & Test of Computers. 37: 35-41
Li Y, Yilmaz E, Sarson P, et al. (2019) Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements Acm Transactions On Design Automation of Electronic Systems. 24: 45
Erol OE, Ozev S. (2019) Knowledge- and Simulation-Based Synthesis of Area-Efficient Passive Loop Filter Incremental Zoom-ADC for Built-In Self-Test Applications Acm Transactions On Design Automation of Electronic Systems. 24: 3
Jeong JW, Kitchen J, Ozev S. (2019) On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration Ieee Design & Test of Computers. 36: 117-125
Badawi D, Ayhan T, Ozev S, et al. (2019) Detecting Gas Vapor Leaks Using Uncalibrated Sensors Ieee Access. 7: 155701-155710
Shafiee M, Ozev S. (2019) Contact-Less Near-Field Test of Active Integrated RF Phased Array Antennas Journal of Electronic Testing. 35: 335-347
Shafiee M, Beohar N, Bakliwal P, et al. (2018) A Disturbance-Free Built-In Self-Test and Diagnosis Technique for DC-DC Converters Acm Transactions On Design Automation of Electronic Systems. 23: 1-22
Beohar N, Malladi VNK, Mandal D, et al. (2018) Online Built-In Self-Test of High Switching Frequency DC–DC Converters Using Model Reference Based System Identification Techniques Ieee Transactions On Circuits and Systems I: Regular Papers. 65: 818-831
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