Jason D. Holm, Ph.D.
Affiliations: | 2009 | Mechanical Engineering | University of Minnesota, Twin Cities, Minneapolis, MN |
Area:
Mechanical Engineering, Physical Chemistry, Materials Science EngineeringGoogle:
"Jason Holm"Parents
Sign in to add mentor| Uwe R. Kortshagen | grad student | 2009 | UMN | |
| (Surface modification of hydrogen-terminated silicon nanoparticles.) | ||||
| Robert Keller | post-doc | 2014-2016 | NIST (Chemistry Tree) | |
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Caplins BW, Holm JD, White RM, et al. (2020) Orientation mapping of graphene using 4D STEM-in-SEM. Ultramicroscopy. 219: 113137 |
| Holm J, Caplins B, Killgore J. (2020) Obtaining diffraction patterns from annular dark-field STEM-in-SEM images: Towards a better understanding of image contrast. Ultramicroscopy. 212: 112972 |
| Caplins BW, White RM, Holm JD, et al. (2019) A Workflow for Imaging 2D Materials using 4D STEM-in-SEM Microscopy and Microanalysis. 25: 218-219 |
| Caplins BW, Holm JD, Keller RR. (2019) Orientation mapping of graphene in a scanning electron microscope Carbon. 149: 400-406 |
| Caplins BW, Holm JD, Keller RR. (2018) Transmission imaging with a programmable detector in a scanning electron microscope. Ultramicroscopy. 196: 40-48 |
| Holm J. (2018) Scattering intensity distribution dependence on collection angles in annular dark-field STEM-in-SEM images. Ultramicroscopy. 195: 12-20 |
| Caplins BW, Holm JD, Keller RR. (2018) Developing a Programmable STEM Detector for the Scanning Electron Microscope Microscopy and Microanalysis. 24: 658-659 |
| Holm JD. (2018) Using a Modular Aperture System to Obtain Annular Dark-Field Image Intensity Distributions as a Function of Scattering Angle. Ultramicroscopy. 195 |
| Holm J, Keller RR. (2017) Acceptance Angle Control for Improved Transmission Imaging in an SEM. Microscopy Today. 25: 12-19 |
| Holm J, White R. (2017) On Mass-Thickness Contrast in Annular Dark-Field STEM-in-SEM Images Microscopy and Microanalysis. 23: 600-601 |