Haldun Kufluoglu, Ph.D.
Affiliations: | 2007 | Electrical and Computer Engineering | Purdue University, West Lafayette, IN, United States |
Area:
Electronics and Electrical EngineeringGoogle:
"Haldun Kufluoglu"Parents
Sign in to add mentor| Muhammad A. Alam | grad student | 2007 | Purdue | |
| (MOSFET degradation due to negative bias temperature instability (NBTI) and hot carrier injection (HCI), and its implications for reliability-aware VLSI design.) | ||||
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Publications
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| Küflüoǧlu H, Chancellor C, Chen M, et al. (2014) Recovery modeling of negative bias temperature instability (nbti) for spice-compatible circuit aging simulators Acm Journal On Emerging Technologies in Computing Systems. 10 |
| Varghese D, Kufluoglu H, Reddy V, et al. (2007) OFF-state degradation in drain-extended NMOS transistors: Interface damage and correlation to dielectric breakdown Ieee Transactions On Electron Devices. 54: 2669-2678 |
| Islam AE, Kufluoglu H, Varghese D, et al. (2007) Recent issues in negative-bias temperature instability: Initial degradation, field dependence of interface trap generation, hole trapping effects, and relaxation Ieee Transactions On Electron Devices. 54: 2143-2154 |
| Küflüog̃lu H, Alam MA. (2007) A generalized reaction-diffusion model with explicit H-H |
| Kang K, Kufluoglu H, Roy K, et al. (2007) Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 26: 1770-1781 |
| Paul BC, Kang K, Kufluoglu H, et al. (2007) Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 26: 743-751 |
| Islam AE, Kufluoglu H, Varghese D, et al. (2007) Critical analysis of short-term negative bias temperature instability measurements: Explaining the effect of time-zero delay for on-the-fly measurements Applied Physics Letters. 90 |
| Alam MA, Kufluoglu H, Varghese D, et al. (2007) A comprehensive model for PMOS NBTI degradation: Recent progress Microelectronics Reliability. 47: 853-862 |
| Küflüoglu H, Alam MA. (2006) Theory of interface-trap-induced NBTI degradation for reduced cross section MOSFETs Ieee Transactions On Electron Devices. 53: 1120-1130 |
| Paul BC, Kang K, Kufluoglu H, et al. (2005) Impact of NBTI on the temporal performance degradation of digital circuits Ieee Electron Device Letters. 26: 560-562 |