Haldun Kufluoglu, Ph.D.

Affiliations: 
2007 Electrical and Computer Engineering Purdue University, West Lafayette, IN, United States 
Area:
Electronics and Electrical Engineering
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"Haldun Kufluoglu"

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Muhammad A. Alam grad student 2007 Purdue
 (MOSFET degradation due to negative bias temperature instability (NBTI) and hot carrier injection (HCI), and its implications for reliability-aware VLSI design.)
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Publications

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Küflüoǧlu H, Chancellor C, Chen M, et al. (2014) Recovery modeling of negative bias temperature instability (nbti) for spice-compatible circuit aging simulators Acm Journal On Emerging Technologies in Computing Systems. 10
Varghese D, Kufluoglu H, Reddy V, et al. (2007) OFF-state degradation in drain-extended NMOS transistors: Interface damage and correlation to dielectric breakdown Ieee Transactions On Electron Devices. 54: 2669-2678
Islam AE, Kufluoglu H, Varghese D, et al. (2007) Recent issues in negative-bias temperature instability: Initial degradation, field dependence of interface trap generation, hole trapping effects, and relaxation Ieee Transactions On Electron Devices. 54: 2143-2154
Küflüog̃lu H, Alam MA. (2007) A generalized reaction-diffusion model with explicit H-H2 dynamics for negative-bias temperature-instability (NBTI) degradation Ieee Transactions On Electron Devices. 54: 1101-1107
Kang K, Kufluoglu H, Roy K, et al. (2007) Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 26: 1770-1781
Paul BC, Kang K, Kufluoglu H, et al. (2007) Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 26: 743-751
Islam AE, Kufluoglu H, Varghese D, et al. (2007) Critical analysis of short-term negative bias temperature instability measurements: Explaining the effect of time-zero delay for on-the-fly measurements Applied Physics Letters. 90
Alam MA, Kufluoglu H, Varghese D, et al. (2007) A comprehensive model for PMOS NBTI degradation: Recent progress Microelectronics Reliability. 47: 853-862
Küflüoglu H, Alam MA. (2006) Theory of interface-trap-induced NBTI degradation for reduced cross section MOSFETs Ieee Transactions On Electron Devices. 53: 1120-1130
Paul BC, Kang K, Kufluoglu H, et al. (2005) Impact of NBTI on the temporal performance degradation of digital circuits Ieee Electron Device Letters. 26: 560-562
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