Hongxia Fang, Ph.D.
Affiliations: | 2011 | Electrical and Computer Engineering | Duke University, Durham, NC |
Area:
Electronics and Electrical Engineering, Computer Engineering, Industrial EngineeringGoogle:
"Hongxia Fang"Parents
Sign in to add mentor| Krishnendu Chakrabarty | grad student | 2011 | Duke | |
| (Design-for-testability and diagnosis methods to target unmodeled defects in integrated circuits and multi-chip boards.) | ||||
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Publications
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| Fang H, Chakrabarty K, Jas A, et al. (2012) Functional test-sequence grading at register-transfer level Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 20: 1890-1894 |
| Fang H, Chakrabarty K, Wang Z, et al. (2012) Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster–Shafer Theory Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 1586-1599 |
| Fang H, Chakrabarty K, Wang Z, et al. (2012) Reproduction and Detection of Board-Level Functional Failure Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 630-643 |
| Fang H, Chakrabarty K, Fujiwara H. (2010) RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences Journal of Electronic Testing. 26: 151-164 |
| Wang Z, Fang H, Chakrabarty K, et al. (2009) Deviation-Based LFSR Reseeding for Test-Data Compression Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 28: 259-271 |