Ning Mi, Ph.D.

Affiliations: 
2009 Electrical Engineering University of California, Riverside, Riverside, CA, United States 
Area:
Electronics and Electrical Engineering
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"Ning Mi"

Parents

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Sheldon X.-D. Tan grad student 2009 UC Riverside
 (Statistical analysis for on-chip power grid networks and interconnects considering process variation.)
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Publications

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Li D, Tan SXD, Mi N, et al. (2010) Efficient power grid integrity analysis using on-the-fly error check and reduction Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 763-768
Shen R, Tan SXD, Mi N, et al. (2010) Statistical modeling and analysis of chip-level leakage power by spectral stochastic method Integration, the Vlsi Journal. 43: 156-165
Eguia TJA, Mi N, Tan SXD. (2009) Statistical decoupling capacitance allocation by effcient numerical quadrature method Proceedings of the 10th International Symposium On Quality Electronic Design, Isqed 2009. 309-316
Mi N, Tan SXD, Yan B. (2009) Multiple block structure-preserving reduced order modeling of interconnect circuits Integration, the Vlsi Journal. 42: 158-168
Mi N, Fan J, Tan SXD, et al. (2008) Statistical analysis of on-chip power delivery networks considering lognormal leakage current variations with spatial correlation Ieee Transactions On Circuits and Systems I: Regular Papers. 55: 2064-2075
Mi N, Tan SXD, Cai Y, et al. (2008) Fast variational analysis of on-chip power grids by stochastic extended Krylov subspace method Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 27: 1996-2006
Fan J, Mi N, Tan SXD. (2007) Voltage drop reduction for on-chip power delivery considering leakage current variations 2007 Ieee International Conference On Computer Design, Iccd 2007. 78-83
Mi N, Tan SXD, Liu P, et al. (2007) Stochastic extended Krylov subspace method for variational analysis of on-chip power grid networks Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers, Iccad. 48-53
Fan J, Mi N, Tan SXD, et al. (2007) Statistical model order reduction for interconnect circuits considering spatial correlations Proceedings -Design, Automation and Test in Europe, Date. 1508-1513
Mi N, Fan J, Tan SXD. (2007) Simulation of power grid networks considering wires and lognormal leakage current variations Bmas 2006 - Proceedings of the 2006 Ieee International Behavioral Modeling and Simulation Workshop. 73-78
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