Alexander Neumann, Ph.D.
Affiliations: | 2013 | Electrical Engineering | University of New Mexico, Albuquerque, NM, United States |
Area:
Optics Physics, Electronics and Electrical EngineeringGoogle:
"Alexander Neumann"Parents
Sign in to add mentorSteven R. J. Brueck | grad student | 2013 | Univ. of New Mexico | |
(Imaging interferometric microscopy to the limits of available frequency space.) |
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Publications
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Nezhadbadeh S, Neumann A, Zarkesh-Ha P, et al. (2020) Chirped-grating spectrometer-on-a-chip. Optics Express. 28: 24501-24510 |
Lee SC, Neumann A, Jiang YB, et al. (2016) Top-down, in-plane GaAs nanowire MOSFETs on an Al2O3 buffer with a trigate oxide from focused ion-beam milling and chemical oxidation. Nanotechnology. 27: 375707 |
Zamiri M, Plis E, Kim JO, et al. (2014) MWIR superlattice detectors integrated with substrate side-illuminated plasmonic coupler Proceedings of Spie - the International Society For Optical Engineering. 9070 |
Kuznetsova Y, Neumann A, Brueck SR. (2012) Solid-immersion imaging interferometric nanoscopy to the limits of available frequency space. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 29: 772-81 |
Neumann A, Kuznetsova Y, Brueck SR. (2008) Optical resolution below lambda/4 using synthetic aperture microscopy and evanescent-wave illumination. Optics Express. 16: 20477-83 |
Zhang Y, Gamble TC, Neumann A, et al. (2008) Electric field control and analyte transport in Si/SiO2 fluidic nanochannels. Lab On a Chip. 8: 1671-5 |
Neumann A, Kuznetsova Y, Brueck SR. (2008) Structured illumination for the extension of imaging interferometric microscopy. Optics Express. 16: 6785-93 |
Kuznetsova Y, Neumann A, Brueck SR. (2008) Imaging interferometric microscopy. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 25: 811-22 |
Zhang J, Zhang S, Li D, et al. (2007) Infrared transmission resonances in double-layered, complementary-structure metallic gratings. Optics Express. 15: 8737-44 |
Kuznetsova Y, Neumann A, Brueck SR. (2007) Imaging interferometric microscopy-approaching the linear systems limits of optical resolution. Optics Express. 15: 6651-63 |