Vimal K. Kamineni, Ph.D.

Affiliations: 
2011 Nanoscale Science and Engineering-Nanoscale Science State University of New York, Albany, Albany, NY, United States 
Area:
Nanoscience, Materials Science Engineering, Condensed Matter Physics
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"Vimal Kamineni"

Parents

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Alain C. Diebold grad student 2011 SUNY Albany
 (Electron-Phonon Interactions and Quantum Confinement Effects on Optical Transitions in Nanoscale Silicon Films.)
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Publications

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Diebold AC, Medikonda M, Muthinti GR, et al. (2013) Fin stress and pitch measurement using X-ray diffraction reciprocal space maps and optical scatterometry Proceedings of Spie - the International Society For Optical Engineering. 8681
Muthinti GR, Medikonda M, Fronheiser J, et al. (2013) Mueller based scatterometry measurement of nanoscale structures with anisotropic in-plane optical properties Proceedings of Spie - the International Society For Optical Engineering. 8681
Nelson FJ, Kamineni VK, Zhang T, et al. (2011) Spectroscopic ellipsometry of CVD graphene Ecs Transactions. 35: 173-183
Grenouillet L, Le Tiec Y, Vu QB, et al. (2011) Ellipsometry measurements on ultrathin silicon on insulator films Proceedings - Ieee International Soi Conference
Kamineni VK, Diebold AC. (2011) Overview of optical metrology of advanced semiconductor materials Aip Conference Proceedings. 1395: 33-40
Kamineni VK, Diebold AC. (2011) Electron-phonon interaction effects on the direct gap transitions of nanoscale Si films Applied Physics Letters. 99
Spratt WT, Huang M, Jia C, et al. (2011) Formation of optical barriers with excellent thermal stability in single-crystal sapphire by hydrogen ion implantation and thermal annealing Applied Physics Letters. 99
Kamineni VK, Hilfiker JN, Freeouf JL, et al. (2011) Extension of Far UV spectroscopic ellipsometry studies of High-κ dielectric films to 130 nm Thin Solid Films. 519: 2894-2898
Tungare M, Kamineni VK, Shahedipour-Sandvik F, et al. (2011) Dielectric properties and thickness metrology of strain engineered GaN/AlN/Si (111) thin films grown by MOCVD Thin Solid Films. 519: 2929-2932
Nelson FJ, Kamineni VK, Zhang T, et al. (2010) Optical properties of large-area polycrystalline chemical vapor deposited graphene by spectroscopic ellipsometry Applied Physics Letters. 97
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