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Martin A. Crimp

Affiliations: 
Materials Science and Engineering Michigan State University, East Lansing, MI 
Area:
Materials Science Engineering, Mechanical Engineering
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"Martin Crimp"
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Parents

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Children

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Reza Loloee grad student 2000 Michigan State
Hong Geng grad student 2003 Michigan State
Benjamin A. Simkin grad student 2003 Michigan State
Biman Ghosh grad student 2004 Michigan State
Gangfeng Ye grad student 2006 Michigan State
Jiaming Zhang grad student 2007 Michigan State
Yiyi Yang grad student 2011 Michigan State
James R. Seal grad student 2014 Michigan State

Collaborators

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Darren E Mason collaborator 1998-2016 Michigan State University (MSU)
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Publications

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Han S, Crimp MA. (2020) ECCI analysis of shear accommodations at grain boundaries in commercially pure alpha titanium International Journal of Plasticity. 131: 102731
Ruggles TJ, Yoo YSJ, Dunlap BE, et al. (2019) Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reduction. Ultramicroscopy. 210: 112927
Kerns RD, Balachandran S, Hunter AH, et al. (2019) Ultra-high spatial resolution selected area electron channeling patterns. Ultramicroscopy. 210: 112915
Marsh AC, Mellott NP, Pajares-Chamorro N, et al. (2019) Fabrication and multiscale characterization of 3D silver containing bioactive glass-ceramic scaffolds. Bioactive Materials. 4: 215-223
Mansour H, Crimp MA, Gey N, et al. (2019) Dislocation analysis of a complex sub-grain boundary in UO2 ceramic using accurate electron channelling contrast imaging in a scanning electron microscope Ceramics International. 45: 18666-18671
Zhang C, Balachandran S, Eisenlohr P, et al. (2018) Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis Scripta Materialia. 144: 74-77
Han S, Eisenlohr P, Crimp MA. (2018) ECCI based characterization of dislocation shear in polycrystalline arrays during heterogeneous deformation of commercially pure titanium Materials Characterization. 142: 504-514
Dunlap BE, Ruggles TJ, Fullwood DT, et al. (2017) Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction. Ultramicroscopy. 184: 125-133
Balachandran S, Radha Z, Colbry D, et al. (2017) Focused Ion Beam (FIB) based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI) Microscopy and Microanalysis. 23: 572-573
Kerns RD, Balachandran S, Hunter AH, et al. (2017) Collection of Selected Area Electron Channeling Patterns (SACP) on an FEI Helios NanoLab Scanning Electron Microscope Microscopy and Microanalysis. 23: 548-549
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