Benjamin A. Simkin, Ph.D.
Affiliations: | 2003 | Michigan State University, East Lansing, MI |
Area:
Materials Science Engineering, Metallurgy Engineering, Applied MechanicsGoogle:
"Benjamin Simkin"Parents
Sign in to add mentorMartin A. Crimp | grad student | 2003 | Michigan State | |
(Tensile crack initiation in gamma-titanium aluminide.) |
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Publications
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Simkin BA, Ng BC, Crimp MA, et al. (2007) Crack opening due to deformation twin shear at grain boundaries in near-γ TiAl Intermetallics. 15: 55-60 |
Bieler TR, Fallahi A, Ng BC, et al. (2005) Fracture initiation/propagation parameters for duplex TiAl grain boundaries based on twinning, slip, crystal orientation, and boundary misorientation Intermetallics. 13: 979-984 |
Ng BC, Simkin BA, Crimp MA, et al. (2004) The role of mechanical twinning on microcrack nucleation and crack propagation in a near-γ TiAl alloy Intermetallics. 12: 1317-1323 |
Crimp MA, Simkin BA, Ng BC, et al. (2003) Microscale characterization of deformation defects in bulk intermetallics alloys using electron channeling contrast imaging Materials Science Forum. 426: 1885-1890 |
Crimp MA, Ng BC, Simkin BA, et al. (2003) Microcrack Nucleation and Crack Propagation in Equiaxed γ TiAl Materials Research Society Symposium - Proceedings. 753: 143-148 |
Simkin BA, Crimp MA, Bieler TR. (2003) A factor to predict microcrack nucleation at γ-γ grain boundaries in TiAl Scripta Materialia. 49: 149-154 |
Simkin BA, Ng BC, Bieler TR, et al. (2003) Orientation determination and defect analysis in the near-cubic intermetallic γ-TiAl using SACP, ECCI, and EBSD Intermetallics. 11: 215-223 |
Simkin BA, Bieler TR, Crimp MA. (2002) Tensile microcrack initiation at γ-γ boundaries in TiAl Proceedings of the Tms Fall Meeting. 309-314 |
Crimp MA, Simkin BA, Ng BC. (2001) Demonstration of the g·b × u = 0 edge dislocation invisibility criterion for electron channelling contrast imaging Philosophical Magazine Letters. 81: 833-837 |
Mason DE, Simkin BA, Crimp MA, et al. (2001) Measurements and modeling of deformation transfer at γ-γ grain boundaries in TiAl Proceedings of the Tms Fall Meeting. 149-160 |