Jun S. Jeoung, Ph.D.

Affiliations: 
2004 University of Arizona, Tucson, AZ 
Area:
Materials Science Engineering, Electronics and Electrical Engineering
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"Jun Jeoung"

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Supapan Seraphin grad student 2004 University of Arizona
 (Structural and electrical characterization of low-dose low-energy SIMOX materials.)
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Publications

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Jutarosaga T, Jeoung JS, Seraphin S. (2005) Infrared spectroscopy of Si-O bonding in low-dose low-energy separation by implanted oxygen materials Thin Solid Films. 476: 303-311
Jeoung JS, Anderson P, Seraphin S. (2003) Microstructural evolution of low-dose separation by implanted oxygen materials implanted at 65 and 100 keV Journal of Materials Research. 18: 2177-2187
Jutarosaga T, Jeoung JS, Seraphin S. (2003) Buried oxide formation in low-dose low-energy SIMOX Microscopy and Microanalysis. 9: 504-505
Jeoung JS, Evans R, Seraphin S. (2002) Microstructural evolution and defects in ultra-thin SIMOX materials during annealing Materials Research Society Symposium - Proceedings. 716: 9-16
Johnson B, Jeoung JS, Anderson P, et al. (2002) Evolution of microstructure during annealing of low-dose SIMOX wafers implanted at 65 keV Journal of Materials Science: Materials in Electronics. 13: 303-308
Jeoung JS, Johnson B, Seraphin S. (2001) Growth of Oxygen Precipitates in Low-Dose Low-Energy Simox Microscopy and Microanalysis. 7: 562-563
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