Boris J. Albers, Ph.D.
Affiliations: | 2008 | Yale University, New Haven, CT |
Area:
Materials Science EngineeringGoogle:
"Boris Albers"Parents
Sign in to add mentor| Udo D. Schwarz | grad student | 2008 | Yale | |
| (Three-dimensional force microscopy with atomic resolution.) | ||||
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Publications
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| Baykara MZ, Schwendemann TC, Albers BJ, et al. (2012) Exploring atomic-scale lateral forces in the attractive regime: a case study on graphite (0001). Nanotechnology. 23: 405703 |
| Albers BJ, Schwendemann TC, Baykara MZ, et al. (2009) Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensions. Nanotechnology. 20: 264002 |
| Albers BJ, Schwendemann TC, Baykara MZ, et al. (2009) Three-dimensional imaging of short-range chemical forces with picometre resolution. Nature Nanotechnology. 4: 307-10 |
| Vaz CAF, Wang HQ, Ahn CH, et al. (2009) Interface and electronic characterization of thin epitaxial Co3 O4 films Surface Science. 603: 291-297 |
| Albers BJ, Liebmann M, Schwendemann TC, et al. (2008) Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy. The Review of Scientific Instruments. 79: 033704 |