Boris J. Albers, Ph.D.

2008 Yale University, New Haven, CT 
Materials Science Engineering
"Boris Albers"


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Udo D. Schwarz grad student 2008 Yale
 (Three-dimensional force microscopy with atomic resolution.)
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Baykara MZ, Schwendemann TC, Albers BJ, et al. (2012) Exploring atomic-scale lateral forces in the attractive regime: a case study on graphite (0001). Nanotechnology. 23: 405703
Albers BJ, Schwendemann TC, Baykara MZ, et al. (2009) Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensions. Nanotechnology. 20: 264002
Albers BJ, Schwendemann TC, Baykara MZ, et al. (2009) Three-dimensional imaging of short-range chemical forces with picometre resolution. Nature Nanotechnology. 4: 307-10
Albers BJ, Liebmann M, Schwendemann TC, et al. (2008) Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy. The Review of Scientific Instruments. 79: 033704
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