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|Firth SK, Campbell WJ, Toprac A, et al. (2006) Just-in-time adaptive disturbance estimation for run-to-run control of semiconductor processes Ieee Transactions On Semiconductor Manufacturing. 19: 298-315|
|Firth SK, Campbell WJ, Edgar TF. (2002) Just-in-time adaptive disturbance estimation for run-to-run control of photolithography overlay Proceedings of Spie - the International Society For Optical Engineering. 4692: 147-154|
|Campbell WJ, Firth SK, Toprac AJ, et al. (2002) A comparison of run-to-run control algorithms Proceedings of the American Control Conference. 3: 2150-2155|