Jayanta Bhadra, Ph.D.

Affiliations: 
2001 University of Texas at Austin, Austin, Texas, U.S.A. 
Area:
Electronics and Electrical Engineering
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"Jayanta Bhadra"

Parents

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Jacob A. Abraham grad student 2001 UT Austin
 (Abstraction techniques for verification of digital designs.)
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Publications

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Hsieh KK, Chen W, Wang LC, et al. (2015) On application of data mining in functional debug Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers, Iccad. 2015: 670-675
Chen W, Wang LC, Bhadra J, et al. (2013) Simulation knowledge extraction and reuse in constrained random processor verification Proceedings - Design Automation Conference
Chen W, Wang LC, Bhadra J, et al. (2013) Novel test analysis to improve structural coverage-A commercial experiment 2013 International Symposium On Vlsi Design, Automation, and Test, Vlsi-Dat 2013
Abadir MS, Bhadra J, Wang LC. (2013) Preface - MTV 2012 Proceedings - International Workshop On Microprocessor Test and Verification
Ray S, Bhadra J, Abadir MS, et al. (2013) Guest Editorial: Test and verification challenges for future microprocessors and SoC designs Journal of Electronic Testing: Theory and Applications (Jetta). 29: 621-623
Chang CL, Wen CHP, Bhadra J. (2013) Process-variation-aware iddq diagnosis for nana-scale CMOS designs - The first step Proceedings -Design, Automation and Test in Europe, Date. 454-457
Ray S, Bhadra J, Abadir MS, et al. (2012) Introduction to special section on verification challenges in the concurrent world Acm Transactions On Design Automation of Electronic Systems. 17
Olivo O, Ray S, Bhadra J, et al. (2012) A unified formal framework for analyzing functional and speed-path properties Proceedings - International Workshop On Microprocessor Test and Verification. 44-45
Chang CL, Chang CC, Chan HL, et al. (2012) An intelligent analysis of Iddq data for chip classification in very deep-submicron (VDSM) CMOS technology Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 163-168
Chen W, Sumikawa N, Wang LC, et al. (2012) Novel test detection to improve simulation efficiency-A commercial experiment Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers, Iccad. 101-108
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