Arun Krishnamachary, Ph.D.

Affiliations: 
2003 University of Texas at Austin, Austin, Texas, U.S.A. 
Area:
Electronics and Electrical Engineering
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"Arun Krishnamachary"

Parents

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Jacob A. Abraham grad student 2003 UT Austin
 (Test generation for realistic defects.)
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Publications

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Krishnamachary A, Abraham JA. (2003) Effects of multi-cycle sensitization on delay tests Proceedings of the Ieee International Conference On Vlsi Design. 2003: 137-142
Abraham JA, Krishnamachary A, Tupuri RS. (2002) A comprehensive fault model for deep submicron digital circuits Proceedings - 1st Ieee International Workshop On Electronic Design, Test and Applications, Delta 2002. 360-364
Krishnamachary A, Abraham JA, Tupuri RS. (2001) Timing verification and delay test generation for hierarchical designs Proceedings of the Ieee International Conference On Vlsi Design. 157-162
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