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|Krishnamachary A, Abraham JA. (2003) Effects of multi-cycle sensitization on delay tests Proceedings of the Ieee International Conference On Vlsi Design. 2003: 137-142|
|Abraham JA, Krishnamachary A, Tupuri RS. (2002) A comprehensive fault model for deep submicron digital circuits Proceedings - 1st Ieee International Workshop On Electronic Design, Test and Applications, Delta 2002. 360-364|
|Krishnamachary A, Abraham JA, Tupuri RS. (2001) Timing verification and delay test generation for hierarchical designs Proceedings of the Ieee International Conference On Vlsi Design. 157-162|