Rajeshwary G. Tayade, Ph.D.

Affiliations: 
2009 Electrical Engineering University of Texas at Austin, Austin, Texas, U.S.A. 
Area:
Electronics and Electrical Engineering
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Parents

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Jacob A. Abraham grad student 2009 UT Austin
 (Incorporating the effect of delay variability in path based delay testing.)
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Publications

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Tayade R, Abraham JA. (2009) Critical path selection for delay test considering coupling noise Proceedings of the 14th Ieee European Test Symposium, Ets 2009. 163-168
Tayade R, Abraham J. (2008) Small-delay defect detection in the presence of process variations Microelectronics Journal. 39: 1093-1100
Tayade RG, Kalyanam VK, Nassif S, et al. (2007) Estimating path delay distribution considering coupling noise Proceedings of the Acm Great Lakes Symposium On Vlsi, Glsvlsi. 61-66
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