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|Tayade R, Abraham JA. (2009) Critical path selection for delay test considering coupling noise Proceedings of the 14th Ieee European Test Symposium, Ets 2009. 163-168|
|Tayade R, Abraham J. (2008) Small-delay defect detection in the presence of process variations Microelectronics Journal. 39: 1093-1100|
|Tayade RG, Kalyanam VK, Nassif S, et al. (2007) Estimating path delay distribution considering coupling noise Proceedings of the Acm Great Lakes Symposium On Vlsi, Glsvlsi. 61-66|