Masoud Hashempour, Ph.D.

Affiliations: 
2008 Electrical and Computer Engineering Northeastern University, Boston, MA, United States 
Area:
Computer Science
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"Masoud Hashempour"

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Fabrizio Lombardi grad student 2008 Northeastern University
 (DNA self -assembly for efficient error-tolerant nanomanufacturing.)
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Publications

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Mashreghian Arani Z, Hashempour M, Lombardi F. (2011) Optimum coding framework for error detection in the self-assembly of the Sierpinski triangle. Iet Nanobiotechnology / Iet. 5: 61-8
Hashempour M, Arani ZM, Lombardi F. (2011) Counting by DNA self-assembly in the presence of rotated tiles Ieee Transactions On Nanotechnology. 10: 632-638
Ma X, Hashempour M, Han J, et al. (2011) Modeling errors in synthesized tile sets for template manufacturing by DNA self-assembly Proceedings of the Ieee Conference On Nanotechnology. 1707-1712
Hashempour M, Arani ZM, Lombardi F. (2010) Modeling gross damage in tile-based nanomanufacturing by DNA self-assembly. Ieee Transactions On Nanobioscience. 9: 193-203
Hashempour M, Mashreghian Arani Z, Lombardi F. (2010) Parallel growth and healing of DNA self-assembly for interconnects. Iet Nanobiotechnology / Iet. 4: 19-28
Ma X, Hashempour M, Wang L, et al. (2010) Manufacturing yield of QCA circuits by synthesized DNA self-assembled templates Proceedings of the Acm Great Lakes Symposium On Vlsi, Glsvlsi. 275-280
Hashempour M, Arani ZM, Lombardi F. (2010) Multiple error detection in DNA self-assembly using coded tiles Ieee Transactions On Circuits and Systems Ii: Express Briefs. 57: 725-729
Arani ZM, Hashempour M, Lombardi F. (2010) An analytical error model for pattern clipping in DNA self-assembly Proceedings - Ieee International Symposium On Defect and Fault Tolerance in Vlsi Systems. 7-15
Arani ZM, Hashempour M, Lombardi F. (2009) A coding framework for DNA self-assembly 2009 Ieee/Acm International Symposium On Nanoscale Architectures, Nanoarch 2009. 15-20
Ma X, Hashempour M, Kim YB, et al. (2009) Errors in DNA self-assembly by synthesized tile sets Proceedings - Ieee International Symposium On Defect and Fault Tolerance in Vlsi Systems. 112-120
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