Ahmet Soylemezoglu, Ph.D.

Affiliations: 
2010 Missouri University of Science and Technology, Rolla, MO, United States 
Area:
Industrial Engineering, Electronics and Electrical Engineering, Mechanical Engineering
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"Ahmet Soylemezoglu"

Parents

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Jagannathan Sarangapani grad student 2010 Missouri University of Science and Technology
 (Sensor data-based decision making.)
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Publications

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Kahveci O, Overbye TJ, Putnam NH, et al. (2016) Optimization framework for topology design challenges in tactical smart microgrid planning 2016 Ieee Power and Energy Conference At Illinois, Peci 2016
Nottage D, Corns S, Soylemezoglu A, et al. (2015) A SysML framework for modeling contingency basing Systems Engineering. 18: 162-177
Zawodniok M, Jagannathan S, Saygin C, et al. (2014) RFID-based asset management of time and temperature sensitive materials Lecture Notes in Mechanical Engineering. 9: 549-561
Soylemezoglu A, Jagannathan S, Saygin C. (2011) Mahalanobis-Taguchi system as a multi-sensor based decision making prognostics tool for centrifugal pump failures Ieee Transactions On Reliability. 60: 864-878
Soylemezoglu A, Jagannathan S, Saygin C. (2010) Mahalanobis taguchi system (MTS) as a prognostics tool for rolling element bearing failures Journal of Manufacturing Science and Engineering, Transactions of the Asme. 132
Soylemezoglu A, Zawodniok MJ, Jagannathan S. (2009) RFID-based smart freezer Ieee Transactions On Industrial Electronics. 56: 2347-2356
Meyyappan L, Soylemezoglu A, Saygin C, et al. (2008) A wasp-based control model for real-time routing of parts in a flexible manufacturing system International Journal of Computer Integrated Manufacturing. 21: 259-268
Mills-Harris MD, Soylemezoglu A, Saygin C. (2007) Erratum: Adaptive inventory management using RFID data (International Journal of Advanced Manufacturing Technology) The International Journal of Advanced Manufacturing Technology. 32
Mills-Harris MD, Soylemezoglu A, Saygin C. (2005) RFID data-based inventory management of time-sensitive materials Iecon Proceedings (Industrial Electronics Conference). 2005: 2302-2307
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