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Patrick Lenahan

Affiliations: 
Engineering Science and Mechanics Pennsylvania State University, State College, PA, United States 
Area:
Electronics and Electrical Engineering, General Physics, Materials Science Engineering
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"Patrick Lenahan"
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Parents

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Ted J. Rowland grad student Harvard

Children

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John F. Conley grad student 1991-1995 Penn State (Chemistry Tree)

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Publications

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Anders MA, Lenahan PM, Ryan JT. (2020) Wafer-Level near Zero Field Spin Dependent Charge Pumping: Effects of Nitrogen on 4H-SiC MOSFETs Materials Science Forum. 1004: 573-580
Harmon NJ, Mcmillan SR, Ashton JP, et al. (2020) Modeling of Near Zero-Field Magnetoresistance and Electrically Detected Magnetic Resonance in Irradiated Si/SiO2 MOSFETs Ieee Transactions On Nuclear Science. 67: 1669-1673
Moxim SJ, Ashton JP, Lenahan PM, et al. (2020) Observation of Radiation-Induced Leakage Current Defects in MOS Oxides With Multifrequency Electrically Detected Magnetic Resonance and Near-Zero-Field Magnetoresistance Ieee Transactions On Nuclear Science. 67: 228-233
McCrory DJ, Anders MA, Ryan JT, et al. (2019) Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station. The Review of Scientific Instruments. 90: 014708
Anders MA, Lenahan PM, Lelis AJ. (2018) The Effect of Nitrogen on the 4H-SiC/SiO2 Interface Studied with Variable Resonance Frequency Spin Dependent Charge Pumping Materials Science Forum. 924: 469-472
Mutch MJ, Lenahan PM, King SW. (2016) Spin transport, magnetoresistance, and electrically detected magnetic resonance in amorphous hydrogenated silicon nitride Applied Physics Letters. 109
Anders MA, Lenahan PM, Cochrane CJ, et al. (2015) Relationship between the 4H-SiC/SiO2 interface structure and electronic properties explored by electrically detected magnetic resonance Ieee Transactions On Electron Devices. 62: 301-308
Anders MA, Lenahan PM, Lelis AJ. (2015) Negative bias instability in 4H-SiC MOSFETS: Evidence for structural changes in the SiC Ieee International Reliability Physics Symposium Proceedings. 2015: 3E41-3E45
Maier RA, Pomorski TA, Lenahan PM, et al. (2015) Acceptor-oxygen vacancy defect dipoles and fully coordinated defect centers in a ferroelectric perovskite lattice: Electron paramagnetic resonance analysis of Mn2+ in single crystal BaTiO3 Journal of Applied Physics. 118
Pomorski TA, Bittel BC, Lenahan PM, et al. (2014) Defect structure and electronic properties of SiOC:H films used for back end of line dielectrics Journal of Applied Physics. 115
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