Yongkook Park, Ph.D.

Affiliations: 
2009 North Carolina State University, Raleigh, NC 
Area:
Materials Science Engineering, Electronics and Electrical Engineering
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"Yongkook Park"

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George A. Rozgonyi grad student 2009 NCSU
 (Electrical properties of grain boundaries and dislocations in crystalline silicon: Influence of impurity incorporation and hydrogenation.)
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Publications

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Park Y, Park HY, Kang DH, et al. (2016) The effect of post-fabrication annealing on an amorphous IGZO visible-light photodetector Journal of Nanoscience and Nanotechnology. 16: 11745-11749
Shim J, Yoo G, Kang DH, et al. (2016) Theoretical and Experimental Investigation of Graphene/High-κ/p-Si Junctions Ieee Electron Device Letters. 37: 4-7
Park Y, Lu J, Park J, et al. (2015) The Influence of Hydrogenation on the Electrical Properties of Impurity-Contaminated Silicon Grain Boundaries Electronic Materials Letters. 11: 993-997
Park Y, Lu J, Park JH, et al. (2015) Impact of structural defect density on gettering of transition metal impurities during phosphorus emitter diffusion in multi-crystalline silicon solar cell processing Electronic Materials Letters. 11: 658-663
Park Y, Lu J, Rozgonyi G. (2010) Segregation and thermal dissociation of hydrogen at the (110)/(001) silicon grain boundary Electronic Materials Letters. 6: 1-5
Lu J, Yu X, Park Y, et al. (2009) Investigation of iron impurity gettering at dislocations in a SiGe/Si heterostructure Journal of Applied Physics. 105: 73712
Park Y, Lu J, Rozgonyi G. (2009) Hydrogen passivation of deep energy levels at the interfacial grain boundary in (110)/(100) bonded silicon wafers Journal of Applied Physics. 105: 14912
Lu J, Park Y, Rozgonyi GA. (2008) Deep level transient spectroscopy and capacitance-voltage study of dislocations and associated defects in SiGeSi heterostructures Journal of Applied Physics. 103
Stoddard N, Wu B, Witting I, et al. (2007) Casting Single Crystal Silicon: Novel Defect Profiles from BP Solar's Mono2 TM Wafers Solid State Phenomena. 1-8
Park Y, Lu J, Rozgonyi GA. (2007) Gettering effect in low and high density structural defect regions of the cast multi-crystalline-silicon wafer Materials Research Society Symposium Proceedings. 994: 289-294
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