Matthew J. Gadlage, Ph.D.
Affiliations: | 2010 | Vanderbilt University, Nashville, TN |
Area:
Electronics and Electrical EngineeringGoogle:
"Matthew Gadlage"Parents
Sign in to add mentor| Ronald D. Schrimpf | grad student | 2010 | Vanderbilt | |
| (Impact of temperature on single-event transients in deep submicrometer bulk and silicon-on-insulator digital CMOS technologies.) | ||||
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Publications
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| Gadlage MJ, Bruce DI, Ingalls JD, et al. (2019) Directional Dependence of Co-60 Irradiation on the Total Dose Response of Flash Memories Ieee Transactions On Nuclear Science. 66: 148-154 |
| Gadlage MJ, Roach AH, Duncan AR, et al. (2018) Multiple-Cell Upsets Induced by Single High-Energy Electrons Ieee Transactions On Nuclear Science. 65: 211-216 |
| Gadlage MJ, Ahlbin JR, Gadfort P, et al. (2017) Characterization of Single-Event Transients in Schmitt Trigger Inverter Chains Operating at Subthreshold Voltages Ieee Transactions On Nuclear Science. 64: 637-642 |
| Gadlage MJ, Roach AH, Duncan AR, et al. (2017) Soft Errors Induced by High-Energy Electrons Ieee Transactions On Device and Materials Reliability. 17: 157-162 |
| Duncan AR, Gadlage MJ, Roach AH, et al. (2016) Characterizing Radiation and Stress-Induced Degradation in an Embedded Split-Gate NOR Flash Memory Ieee Transactions On Nuclear Science. 63: 1276-1283 |
| Gadlage MJ, Roach AH, Duncan AR, et al. (2015) Electron-Induced Single-Event Upsets in 45-nm and 28-nm Bulk CMOS SRAM-Based FPGAs Operating at Nominal Voltage Ieee Transactions On Nuclear Science. 62: 2717-2724 |
| Kay MJ, Gadlage MJ, Duncan AR, et al. (2013) Using charge accumulation to improve the radiation tolerance of multi-Gb nand flash memories Ieee Transactions On Nuclear Science. 60: 4214-4219 |
| Ingalls JD, Gadlage MJ, Duncan AR, et al. (2013) Implications of the logical decode on the radiation response of a multi-level cell NAND flash memory Ieee Transactions On Nuclear Science. 60: 4451-4456 |
| Gadlage MJ, Kay MJ, Ingalls JD, et al. (2013) Impact of X-ray exposure on a triple-level-cell NAND flash Ieee Transactions On Nuclear Science. 60: 4533-4539 |
| Gadlage MJ, Kay MJ, Duncan AR, et al. (2012) Impact of neutron-induced displacement damage on the multiple bit upset sensitivity of a bulk CMOS SRAM Ieee Transactions On Nuclear Science. 59: 2722-2728 |