David R. Hughart, Ph.D.

Affiliations: 
2012 Electrical Engineering Vanderbilt University, Nashville, TN 
Area:
Electronics and Electrical Engineering
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Ronald Schrimpf grad student 2012 Vanderbilt
 (Variations in radiation response due to hydrogen: Mechanisms of interface trap buildup and annealing.)
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Publications

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Hughart DR, Schrimpf RD, Fleetwood DM, et al. (2012) The effects of proton-defect interactions on radiation-induced interface-trap formation and annealing Ieee Transactions On Nuclear Science. 59: 3087-3092
Hughart DR, Schrimpf RD, Fleetwood DM, et al. (2011) Mechanisms of interface trap buildup and annealing during elevated temperature irradiation Ieee Transactions On Nuclear Science. 58: 2930-2936
Tuttle BR, Hughart DR, Schrimpf RD, et al. (2010) Defect interactions of H2 in SiO2: Implications for ELDRS and latent interface trap buildup Ieee Transactions On Nuclear Science. 57: 3046-3053
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