Taisuke Ohta, Ph.D.

Affiliations: 
2004 University of Washington, Seattle, Seattle, WA 
Area:
Materials Science Engineering, Condensed Matter Physics
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"Taisuke Ohta"

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Fumio S. Ohuchi grad student 2004 University of Washington
 (Heteroepitaxy of gallium-selenide on silicon(100) and (111): New silicon-compatible semiconductor thin films for nano structure formation.)
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Publications

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Thomas CJ, Fonseca JJ, Spataru CD, et al. (2021) Electronic Structure and Stacking Arrangement of Tungsten Disulfide at the Gold Contact. Acs Nano
Berg M, Liu F, Smith S, et al. (2019) Imaging Atomically Thin Semiconductors Beneath Dielectrics via Deep Ultraviolet Photoemission Electron Microscopy Physical Review Applied. 12
Berg M, Kephart JM, Munshi A, et al. (2018) Local Electronic Structure Changes in Polycrystalline CdTe with CdClTreatment and Air Exposure. Acs Applied Materials & Interfaces
Robinson JT, Culbertson J, Berg M, et al. (2018) Work Function Variations in Twisted Graphene Layers. Scientific Reports. 8: 2006
Keyshar K, Berg M, Zhang X, et al. (2017) Experimental Determination of the Ionization Energies of MoSe2, WS2, and MoS2 on SiO2 Using Photoemission Electron Microscopy. Acs Nano
Berg M, Keyshar K, Bilgin I, et al. (2017) Layer dependence of the electronic band alignment of few-layer MoS2 on SiO2 measured using photoemission electron microscopy Physical Review B. 95
Ohta T, Berg M, Keyshar K, et al. (2017) Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors Microscopy and Microanalysis. 23: 1504-1505
Beechem TE, Shaffer RA, Nogan J, et al. (2016) Self-Heating and Failure in Scalable Graphene Devices. Scientific Reports. 6: 26457
Ahmed AS, Wen H, Ohta T, et al. (2016) Molecular beam epitaxy growth of SrO buffer layers on graphite and graphene for the integration of complex oxides Journal of Crystal Growth. 447: 5-12
Peters DW, Davids PS, Kim JK, et al. (2015) Plasmonic nanoantennas for enhanced midwave and longwave infrared imaging Proceedings of Spie - the International Society For Optical Engineering. 9467
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