Farzan Farbiz, Ph.D.

Affiliations: 
2010 University of Illinois, Urbana-Champaign, Urbana-Champaign, IL 
Area:
Electronics and Electrical Engineering
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"Farzan Farbiz"

Parents

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Elyse Rosenbaum grad student 2010 UIUC
 (Modeling and suppression of latchup.)
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Publications

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Farbiz F, Rosenbaum E. (2011) Modeling and understanding of external latchup in CMOS technologies-part II: Minority carrier collection efficiency Ieee Transactions On Device and Materials Reliability. 11: 426-432
Farbiz F, Rosenbaum E. (2011) Modeling and understanding of external latchup in CMOS technologies-part I: Modeling latchup trigger current Ieee Transactions On Device and Materials Reliability. 11: 417-425
Farbiz F, Rosenbaum E. (2010) Understanding transient latchup hazards and the impact of guard rings Ieee International Reliability Physics Symposium Proceedings. 466-473
Farbiz F, Rosenbaum E. (2009) A new compact model for external latchup Microelectronics Reliability. 49: 1447-1454
Farbiz F, Rosenbaum E. (2008) Modeling of majority and minority carrier triggered external latchup Ieee International Reliability Physics Symposium Proceedings. 270-277
Farbiz F, Rosenbaum E. (2008) Guard ring interactions and their effect on CMOS latchup resilience Technical Digest - International Electron Devices Meeting, Iedm
Farbiz F, Rosenbaum E. (2007) An investigation of external latchup Annual Proceedings - Reliability Physics (Symposium). 600-601
Farbiz F, Rosenbaum E. (2007) Analytical modeling of external latchup Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Taherzadeh-S M, Amelifard B, Iman-Eini H, et al. (2003) Power and delay estimation of CMOS inverters using fully analytical approach 2003 Southwest Symposium On Mixed-Signal Design, Ssmsd 2003. 116-120
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