Kunigunde H. Cherenack, Ph.D.
Affiliations: | 2009 | Princeton University, Princeton, NJ |
Area:
Electronics and Electrical EngineeringGoogle:
"Kunigunde Cherenack"Parents
Sign in to add mentorSigurd Wagner | grad student | 2009 | Princeton | |
(Fabricating silicon thin -film transistors on plastic at 300°C.) |
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Publications
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Erb RM, Cherenack KH, Stahel RE, et al. (2012) Locally reinforced polymer-based composites for elastic electronics. Acs Applied Materials & Interfaces. 4: 2860-4 |
Sturm JC, Huang Y, Han L, et al. (2011) Amorphous silicon: The other silicon 2011 12th International Conference On Ultimate Integration On Silicon, Ulis 2011. 34-37 |
Münzenrieder NS, Cherenack KH, Tröster G. (2011) Testing of flexible InGaZnO-based thin-film transistors under mechanical strain Epj Applied Physics. 55 |
Cherenack K, Tröster G. (2010) The Path Towards Woven Thin-film Transistors Mrs Proceedings. 1256 |
Cherenack KH, Hekmatshoar B, Sturm JC, et al. (2010) Self-aligned amorphous silicon thin-film transistors fabricated on clear plastic at 300°C Ieee Transactions On Electron Devices. 57: 2381-2389 |
Cherenack KH, Munzenrieder NS, Troster G. (2010) Impact of mechanical bending on ZnO and IGZO thin-film transistors Ieee Electron Device Letters. 31: 1254-1256 |
Wagner S, Han L, Hekmatshoar B, et al. (2010) 61.3: Amorphous silicon TFT technology for rollable OLED displays 48th Annual Sid Symposium, Seminar, and Exhibition 2010, Display Week 2010. 2: 917-920 |
Wagner S, Han L, Hekmatshoar B, et al. (2010) 61.3: Amorphous silicon TFT technology for rollable OLED displays 48th Annual Sid Symposium, Seminar, and Exhibition 2010, Display Week 2010. 2: 917-920 |
Cherenack KH, Kattamis AZ, Hekmatshoar B, et al. (2009) Amorphous Silicon Thin-Film Transistors made on Clear Plastic at 300 °C Journal of the Korean Physical Society. 54: 415-420 |
Sturm JC, Hekmatshoar B, Cherenack K, et al. (2009) 65.1 : Invited Paper: Amorphous Silicon TFT's with 100-Year Lifetimes in a Clear Plastic Compatible Process for AMOLEDs Sid Symposium Digest of Technical Papers. 40: 979 |