Ding-Yuan Chen, Ph.D.
Affiliations: | 2006 | University of Michigan, Ann Arbor, Ann Arbor, MI |
Area:
Electronics and Electrical EngineeringGoogle:
"Ding-Yuan Chen"Parents
Sign in to add mentorJamie D. Phillips | grad student | 2006 | University of Michigan | |
(Ferroelectric thin films for microwave and photonics applications.) |
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Publications
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Sun X, Zhang C, Chang J, et al. (2016) Mixed-solvent-vapor annealing of perovskite for photovoltaic device efficiency enhancement Nano Energy. 28: 417-425 |
Guo L, Liu S, Chen D, et al. (2016) Structure and scintillation properties of CsI(Tl) films on Si single crystal substrates Applied Surface Science. 384: 225-229 |
Chen DY, Phillips JD. (2006) Analysis and design optimization of electrooptic interferometric modulators for microphotonics applications Journal of Lightwave Technology. 24: 2340-2345 |
Siddiqui J, Cagin E, Chen D, et al. (2006) ZnO thin-film transistors with polycrystalline (Ba,Sr) Ti O 3 gate insulators Applied Physics Letters. 88 |
Chen DY, Phillips JD. (2006) Electric field dependence of piezoelectric coefficient in ferroelectric thin films Journal of Electroceramics. 17: 613-617 |
Chen DY, Phillips JD. (2005) Hysteretic electro-optic response in ferroelectric thin films Proceedings of Spie - the International Society For Optical Engineering. 5867: 1-7 |
Chen DY, Phillips JD. (2005) Extraction of electro-optic coefficient in thin-film linear electro-optic Mach-Zehnder interferometers with nonperiodic intensity-voltage output characteristics Optical Engineering. 44: 1-6 |
Murphy TE, Chen DY, Cagin E, et al. (2005) Electronic properties of ZnO epilayers grown on c-plane sapphire by plasma-assisted molecular beam epitaxy Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 23: 1277-1280 |
Chen DY, Murphy TE, Phillips JD. (2005) Properties of ferroelectric Pb(Zr,Ti)O |
Murphy TE, Chen DY, Phillips JD. (2005) Growth and electronic properties of ZnO epilayers by plasma-assisted molecular beam epitaxy Journal of Electronic Materials. 34: 699-703 |