Xiahan Sang, Ph.D.
Affiliations: | 2012 | University of Pittsburgh, Pittsburgh, PA, United States |
Area:
Materials Science EngineeringGoogle:
"Xiahan Sang"Parents
Sign in to add mentorJorg M. K. Wiezorek | grad student | 2012 | University of Pittsburgh | |
(Electron density determination and bonding in tetragonal binary intermetallics by convergent beam electron diffraction.) |
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Publications
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Li X, Kahn E, Chen G, et al. (2020) Surfactant-Mediated Growth and Patterning of Atomically Thin Transition Metal Dichalcogenides. Acs Nano |
Chen C, Sang X, Cui W, et al. (2020) Atomic-resolution fine structure and chemical reaction mechanism of Gd/YbAl3 thermoelectric-magnetocaloric heterointerface Journal of Alloys and Compounds. 831: 154722 |
Cui W, Hu Z, Unocic RR, et al. (2020) Atomic defects, functional groups and properties in MXenes Chinese Chemical Letters |
Wang Y, Cui W, Yu J, et al. (2019) One-step growth of amorphous/crystalline Ga2O3 phase-junctions for high performance solar-blind photodetection. Acs Applied Materials & Interfaces |
Guo W, Pei Z, Sang X, et al. (2019) Shape-preserving machining produces gradient nanolaminate medium entropy alloys with high strain hardening capability Acta Materialia. 170: 176-186 |
Yu L, Han R, Sang X, et al. (2018) Shell-Induced Ostwald Ripening: Simultaneous Structure, Composition, and Morphology Transformations during the Creation of Hollow Iron Oxide Nanocapsules. Acs Nano |
Sang X, Xie Y, Yilmaz DE, et al. (2018) In situ atomistic insight into the growth mechanisms of single layer 2D transition metal carbides. Nature Communications. 9: 2266 |
Sang X, Li X, Zhao W, et al. (2018) In situ edge engineering in two-dimensional transition metal dichalcogenides. Nature Communications. 9: 2051 |
Ding J, Balachandran J, Sang X, et al. (2018) Influence of Non-stoichiometry on Proton Conductivity in Thin Film Yttrium-doped Barium Zirconate. Acs Applied Materials & Interfaces |
Sang X, Li X, Geohegan DB, et al. (2018) Atomistic Insights into Thermolysis and Growth of Two-Dimensional MoS2 Using In situ Electron Microscopy Microscopy and Microanalysis. 24: 1568-1569 |