Sarah E. Armstrong, Ph.D.
Affiliations: | 2011 | Vanderbilt University, Nashville, TN |
Area:
Electronics and Electrical EngineeringGoogle:
"Sarah Armstrong"Parents
Sign in to add mentor| Lloyd W. Massengill | grad student | 2011 | Vanderbilt | |
| (Single-event characterization and mitigation in high-speed CMOS communications devices.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Blaine RW, Atkinson NM, Kauppila JS, et al. (2012) Differential charge cancellation (DCC) layout as an rhbd technique for bulk CMOS differential circuit design Ieee Transactions On Nuclear Science. 59: 2867-2871 |
| Blaine RW, Atkinson NM, Kauppila JS, et al. (2012) Single-event-hardened CMOS operational amplifier design Ieee Transactions On Nuclear Science. 59: 803-810 |
| Armstrong SE, Blaine RW, Holman WT, et al. (2012) Single-event analysis and hardening of mixed-signal circuit interfaces in high-speed communications devices Ieee Transactions On Nuclear Science. 59: 1027-1033 |
| Blaine RW, Armstrong SE, Kauppila JS, et al. (2011) RHBD bias circuits utilizing sensitive node active charge cancellation Ieee Transactions On Nuclear Science. 58: 3060-3066 |
| Armstrong SE, Loveless TD, Hicks JR, et al. (2011) Phase-dependent single-event sensitivity analysis of high-speed A/MS circuits extracted from asynchronous measurements Ieee Transactions On Nuclear Science. 58: 1066-1071 |
| Armstrong SE, Blaine RW, Holman WT, et al. (2011) Single-event vulnerability of mixed-signal circuit interfaces Proceedings of the European Conference On Radiation and Its Effects On Components and Systems, Radecs. 485-488 |
| Blaine RW, Atkinson NM, Kauppila JS, et al. (2011) A single-event-hardened CMOS operational amplifier design Proceedings of the European Conference On Radiation and Its Effects On Components and Systems, Radecs. 123-127 |
| Armstrong SE, Olson BD, Holman WT, et al. (2010) Demonstration of a differential layout solution for improved ASET tolerance in CMOS A/MS circuits Ieee Transactions On Nuclear Science. 57: 3615-3619 |
| Armstrong SE, Olson BD, Popp J, et al. (2009) Single-event transient error characterization of a radiation-hardened by design 90 nm SerDes transmitter driver Ieee Transactions On Nuclear Science. 56: 3463-3468 |
| Casey MC, Armstrong SE, Arora R, et al. (2009) Effect of total ionizing dose on a bulk 130 nm ring oscillator operating at ultra-low power Ieee Transactions On Nuclear Science. 56: 3262-3266 |