Amine Bermak

Affiliations: 
Electronic and Computer Engineering Hong Kong University of Science and Technology, Clear Water Bay, New Territories, Hong Kong 
Area:
Electronics and Electrical Engineering, Computer Engineering
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"Amine Bermak"
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Publications

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Chen J, Wu Y, Yang Y, et al. (2021) An Efficient Memristor-Based Circuit Implementation of Squeeze-and-Excitation Fully Convolutional Neural Networks. Ieee Transactions On Neural Networks and Learning Systems
Tang F, Li Z, Yang T, et al. (2020) A Noise-reduced Light-to-frequency Converter for Sub-0.1% Perfusion Index Blood SpO2 Sensing. Ieee Transactions On Biomedical Circuits and Systems
Duan M, Zhong X, Xu J, et al. (2020) A High Offset Distribution Tolerance High Resolution ISFET Array with Auto-Compensation for Long-Term Bacterial Metabolism Monitoring. Ieee Transactions On Biomedical Circuits and Systems
Yi Y, Wang B, Bermak A. (2019) A Low-Cost Strain Gauge Displacement Sensor Fabricated via Shadow Mask Printing. Sensors (Basel, Switzerland). 19
Tang F, Shu Z, Li M, et al. (2018) A Low Power and Fast Tracking Light-to-Frequency Converter with Adaptive Power Scaling for Blood SpO2 Sensing. Ieee Transactions On Biomedical Circuits and Systems
Chen J, Chen Z, Boussaid F, et al. (2018) Ultra-Low Power Smart Electronic Nose System Based on Three-Dimensional Tin-Oxide Nanotube Arrays. Acs Nano
Ahmed A, Zhao X, Gruev V, et al. (2017) Residual interpolation for division of focal plane polarization image sensors. Optics Express. 25: 10651-10662
Wei X, Phung SL, Bouzerdoum A, et al. (2016) Invariant image recognition under projective deformations: An image normalization approach 2015 Visual Communications and Image Processing, Vcip 2015
Tang F, Shu Z, Ye K, et al. (2016) A Linear 126-dB Dynamic Range Light-to-Frequency Converter With Dark Current Suppression Upto 125 °C for Blood Oxygen Concentration Detection Ieee Transactions On Electron Devices
Tang F, Li S, Wang B, et al. (2016) A Low Power Class-AB Audio Power Amplifier With Dynamic Transconductance Compensation in 55 nm CMOS Process Ieee Transactions On Circuits and Systems I: Regular Papers
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