Willem G. Odendaal

Affiliations: 
Electrical and Computer Engineering Virginia Polytechnic Institute and State University, Blacksburg, VA, United States 
Area:
Materials Science Engineering
Website:
https://ieeexplore.ieee.org/author/37270983600
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"Willem Odendaal"
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Publications

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Sung V, Odendaal WG. (2015) Litz Wire Pulsed Power Air Core Coupled Inductor Ieee Transactions On Industry Applications. 51: 3385-3393
Burgos R, Chen G, Wang F, et al. (2012) Reliability-oriented design of three-phase power converters for aircraft applications Ieee Transactions On Aerospace and Electronic Systems. 48: 1249-1263
Wang S, Lee FC, Odendaal WG. (2006) Cancellation of capacitor parasitic parameters for noise reduction application Ieee Transactions On Power Electronics. 21: 1125-1132
Wang S, Lee FC, Odendaal WG, et al. (2005) Improvement of EMI filter performance with parasitic coupling cancellation Pesc Record - Ieee Annual Power Electronics Specialists Conference. 2005: 1780-1786
Chen R, van Wyk JD, Wang S, et al. (2005) Improving the characteristics of integrated EMI filters by embedded conductive layers Ieee Transactions On Power Electronics. 20: 611-619
Wang S, de Rooij MA, Odendaal WG, et al. (2005) Reduction of high-frequency conduction losses using a planar litz structure Ieee Transactions On Power Electronics. 20: 261-267
Wang S, Lee FC, Odendaal WG. (2005) Characterization and parasitic extraction of EMI filters using scattering parameters Ieee Transactions On Power Electronics. 20: 502-510
Wang S, Chen R, Van Wyk JD, et al. (2005) Developing parasitic cancellation technologies to improve EMI filter performance for switching mode power supplies Ieee Transactions On Electromagnetic Compatibility. 47: 921-929
Wang S, Van Wyk JD, Lee FC, et al. (2005) Transmission-line effects of power interconnects on EMI filter high-frequency performance Pesc Record - Ieee Annual Power Electronics Specialists Conference. 2005: 1908-1914
Wang S, Lee FC, Chen DY, et al. (2004) Effects of parasitic parameters on EMI filter performance Ieee Transactions On Power Electronics. 19: 869-877
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