Joseph R. Salfi, Ph.D.

Affiliations: 
2011 Electrical and Computer Engineering University of Toronto, Toronto, ON, Canada 
Area:
Electronics and Electrical Engineering, Condensed Matter Physics, Materials Science Engineering
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"Joseph Salfi"

Parents

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Harry E. Ruda grad student University of Toronto
Harry Rudu grad student 2011 University of Toronto
 (Carrier Transport and Sensing in Compound Semiconductor Nanowires.)
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Publications

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Kobayashi T, Salfi J, Chua C, et al. (2020) Engineering long spin coherence times of spin-orbit qubits in silicon. Nature Materials
Ng KSH, Voisin B, Johnson BC, et al. (2020) Scanned Single-Electron Probe inside a Silicon Electronic Device. Acs Nano
Bayat A, Voisin B, Buchs G, et al. (2020) Certification of spin-based quantum simulators Physical Review A. 101
Philippopoulos P, Chesi S, Salfi J, et al. (2019) Hole spin echo envelope modulations Physical Review B. 100: 125402
van der Heijden J, Kobayashi T, House MG, et al. (2018) Readout and control of the spin-orbit states of two coupled acceptor atoms in a silicon transistor. Science Advances. 4: eaat9199
Tankasala A, Salfi J, Bocquel J, et al. (2018) Two-electron states of a group-V donor in silicon from atomistic full configuration interactions Physical Review B. 97
Abadillo-Uriel JC, Salfi J, Hu X, et al. (2018) Entanglement control and magic angles for acceptor qubits in Si Applied Physics Letters. 113: 012102
Usman M, Voisin B, Salfi J, et al. (2017) Towards visualisation of central-cell-effects in scanning tunnelling microscope images of subsurface dopant qubits in silicon. Nanoscale
Salfi J, Mol JA, Culcer D, et al. (2016) Charge-Insensitive Single-Atom Spin-Orbit Qubit in Silicon. Physical Review Letters. 116: 246801
Usman M, Bocquel J, Salfi J, et al. (2016) Spatial metrology of dopants in silicon with exact lattice site precision. Nature Nanotechnology
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