Manisha Dixit, Ph.D.
Affiliations: | 2013 | Materials Science and Engineering | Ohio State University, Columbus, Columbus, OH |
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Materials Science EngineeringGoogle:
"Manisha Dixit"Parents
Sign in to add mentorHamish L. Fraser | grad student | 2013 | Ohio State | |
(Structure-Property Correlations in Double Perovskite Systems.) |
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Publications
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Meyer TL, Dixit M, Williams REA, et al. (2014) Cation non-stoichiometry in pulsed laser deposited Sr2+yFe 1+xMo1-xO6 epitaxial films Journal of Applied Physics. 116 |
Esser BD, D'Alfonso AJ, Dixit M, et al. (2014) Understanding B-site disorder in HAADF-STEM images of double perovskite thin films using the quantum excitation of phonons model Microscopy and Microanalysis. 20: 184-185 |
Lucy JM, Hauser AJ, Wang HL, et al. (2013) Buffer-layer enhanced structural and electronic quality in ferrimagnetic Sr2CrReO6 epitaxial films Applied Physics Letters. 103 |
Esser B, Dixit M, Hauser A, et al. (2013) Viability of HAADF-STEM Imaging Contrast and Simulations as a Measure of B-site Ordering for Double Perovskites Microscopy and Microanalysis. 19: 610-611 |
Hauser AJ, Soliz JR, Dixit M, et al. (2012) Fully ordered Sr 2CrReO 6 epitaxial films: A high-temperature ferrimagnetic semiconductor Physical Review B - Condensed Matter and Materials Physics. 85 |
Williams R, Dixit M, Mishra R, et al. (2012) Comparative Study for Simulation of EELS Core Loss for Transition Metals in Double Perovskite Systems Microscopy and Microanalysis. 18: 308-309 |
Hauser AJ, Williams REA, Ricciardo RA, et al. (2011) Unlocking the potential of half-metallic Sr2FeMoO6 films through controlled stoichiometry and double-perovskite ordering Physical Review B - Condensed Matter and Materials Physics. 83 |
Williams R, Hauser A, Richiardo R, et al. (2011) HR-STEM Imaging and EELS Characterizing of Nano-Scale Defects in Sputter Deposited Thin Films of Double-Perovskite Sr2FeMoO6 (SFMO) and Sr2CrReO6 (SCRO) Microscopy and Microanalysis. 17: 1654-1655 |
Williams R, Dixit M, Mishra R, et al. (2010) Structural and Compositional Transitions at the Atomic Scale Across Interfaces, Faults and Phase Separations in Complex Oxides Microscopy and Microanalysis. 16: 1404-1405 |