Sean Sengele, Ph.D.
Affiliations: | 2012 | Electrical Engineering | University of Wisconsin, Madison, Madison, WI |
Area:
Electronics and Electrical EngineeringGoogle:
"Sean Sengele"Parents
Sign in to add mentorJohn H. Booske | grad student | 2012 | UW Madison | |
(Impact of Random Fabrication Errors on the Performance of a Contrawound Helix Slow-Wave Structure for a Millimeter-Wave Traveling Wave Tube.) |
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Publications
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Sengele S, Barsanti ML, Hargreaves TA, et al. (2014) Backward-wave suppression analysis, and design and fabrication of a prototype millimeter-wave ring-bar slow-wave structure Ieee Transactions On Plasma Science. 42: 3949-3960 |
Sengele S, Barsanti ML, Hargreaves TA, et al. (2013) Impact of random fabrication errors on fundamental forward-wave small-signal gain and bandwidth in traveling-wave tubes with finite-space-charge electron beams Ieee Transactions On Electron Devices. 60: 1221-1227 |
Sengele S, Barsanti ML, Hargreaves TA, et al. (2013) Impact of random fabrication errors on backward-wave small-signal gain in traveling wave tubes with finite space charge electron beams Journal of Applied Physics. 113 |
Sengele S, Barsanti M, Hargreaves T, et al. (2012) Advances in fabrication error analysis for a mm-wave ring-bar TWT circuit 2012 Ieee 13th International Vacuum Electronics Conference, Ivec 2012. 539-540 |
Sengele S, Jiang H, Booske JH, et al. (2009) Microfabrication and characterization of a selectively metallized w-band meander-line TWT circuit Ieee Transactions On Electron Devices. 56: 730-737 |
Marconnet AM, He MM, Sengele S, et al. (2009) Microfabricated silicon high-frequency waveguide couplers and antennas Ieee Transactions On Electron Devices. 56: 721-729 |
Sule N, Scharer J, Booske J, et al. (2009) Measurement and analysis of advanced field emission cold cathodes Ieee International Conference On Plasma Science |
Sule N, Scharer J, Booske J, et al. (2009) Measurement and analysis of advanced field emitting cold cathodes 2009 Ieee International Vacuum Electronics Conference, Ivec 2009. 199-200 |
He X, Scharer J, Booske J, et al. (2009) Examination of cathode emission area variation with applied electric field Journal of Applied Physics. 105 |
He X, Scharer J, Booske J, et al. (2008) One-dimensional combined field and thermionic emission model and comparison with experimental results Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 26: 770-777 |