Qiaojian Huang, Ph.D.
Affiliations: | 2008 | University of Illinois at Chicago, Chicago, IL, United States |
Area:
Mechanical Engineering, Electronics and Electrical Engineering, Materials Science EngineeringGoogle:
"Qiaojian Huang"Parents
Sign in to add mentorCarmen Lilley | grad student | 2008 | University of Illinois, Chicago | |
(Size and surface effects on the electrical properties of metallic nanowires.) |
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Publications
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Huang Q, Lilley CM, Divan R. (2009) An in situ investigation of electromigration in Cu nanowires. Nanotechnology. 20: 075706 |
Huang Q, Lilley CM, Bode M. (2009) Characterization of electron surface scattering in single crystalline metallic nanowires 2009 Ieee Nanotechnology Materials and Devices Conference, Nmdc 2009. 61-63 |
Huang Q, Lilley CM, Bode M. (2009) Surface scattering effect on the electrical resistivity of single crystalline silver nanowires self-assembled on vicinal Si (001) Applied Physics Letters. 95 |
Huang Q, Lilley CM, Divan R, et al. (2008) Electrical failure analysis of Au nanowires Ieee Transactions On Nanotechnology. 7: 688-692 |
Huang Q, Lilley CM, Bode M, et al. (2008) Electrical properties of Cu nanowires 2008 8th Ieee Conference On Nanotechnology, Ieee-Nano. 549-552 |
Huang Q, Lilley CM, Bode M, et al. (2008) Surface and size effects on the electrical properties of Cu nanowires Journal of Applied Physics. 104 |
Lilley CM, Huang Q, Meyer RJ. (2007) Surface effects on metallic nanowires and the stability of material properties 2007 7th Ieee International Conference On Nanotechnology - Ieee-Nano 2007, Proceedings. 267-270 |
Huang Q, Lilley CM, Paing KM. (2006) Contamination effect on the electrical resistivity of gold nanowires American Society of Mechanical Engineers, Electronic and Photonic Packaging, Epp |
Lilley CM, Huang Q. (2006) Surface contamination effects on resistance of gold nanowires Applied Physics Letters. 89 |
Huang QJ, Paing KM, Lilley CM. (2006) Analysis of contamination in nanoscaled film structures with TEM & XPS Microscopy and Microanalysis. 12: 734-735 |