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Hamed Parvaneh, Ph.D.

Affiliations: 
2014 Materials Engineering Rensselaer Polytechnic Institute, Troy, NY, United States 
Area:
Materials Science Engineering
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"Hamed Parvaneh"
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Robert Hull grad student 2014 RPI
 (A new route to nanoscale tomographic chemical analysis: Focused ion beam-induced auger electron spectrosocpy.)

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Parvaneh H, Hull R. (2014) Ion-induced auger electron spectroscopy as a potential route to chemical focused-ion beam tomography Microscopy and Microanalysis. 20: 310-311
Parvaneh H, Hull R. (2014) Examination of ion-induced Auger electron spectra of Ti, Cr and Co in a mass-selecting Focused Ion Beam with a gold-silicon liquid metal source Vacuum. 110: 69-73
Van Den Boom RJJ, Parvaneh H, Voci D, et al. (2009) Helium ion beam microscopy for copper grain identification in BEOL structures Aip Conference Proceedings. 1173: 309-313
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