Keith E. Holbert

Affiliations: 
Arizona State University, Tempe, AZ, United States 
Area:
Electronics and Electrical Engineering, Materials Science Engineering
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"Keith Holbert"
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Publications

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Muthuseenu K, Barnaby H, Patadia A, et al. (2020) Ionizing radiation tolerance of stacked Si3N4-SiO2 gate insulators for power MOSFETs Microelectronics Reliability. 104: 113554
Taggart JL, Jacobs-Gedrim RB, McLain ML, et al. (2019) Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage Effects Ieee Transactions On Nuclear Science. 66: 69-76
Clark LT, Adams J, Holbert KE. (2019) Reliable techniques for integrated circuit identification and true random number generation using 1.5-transistor flash memory Integration. 65: 263-272
Taggart JL, Chen W, Gonzalez-Velo Y, et al. (2018) In Situ Synaptic Programming of CBRAM in an Ionizing Radiation Environment Ieee Transactions On Nuclear Science. 65: 192-199
Gao L, Holbert KE, Yu S. (2017) Total Ionizing Dose Effects of Gamma-Ray Radiation on NbO x -Based Selector Devices for Crossbar Array Memory Ieee Transactions On Nuclear Science. 64: 1535-1539
Chen W, Fang R, Barnaby HJ, et al. (2017) Total-Ionizing-Dose Effects on Resistance Stability of Programmable Metallization Cell Based Memory and Selectors Ieee Transactions On Nuclear Science. 64: 269-276
Anderson BC, Holbert KE, Bowler H. (2016) Design, Construction, and Modeling of a 252Cf Neutron Irradiator Science and Technology of Nuclear Installations. 2016
Gonzalez-Velo Y, Mahmud A, Chen W, et al. (2016) Radiation hardening by process of CBRAM resistance switching cells Ieee Transactions On Nuclear Science. 63: 2145-2151
Mahmud A, Gonzalez-Velo Y, Saremi M, et al. (2016) Flexible Ag-ChG Radiation Sensors: Limit of Detection and Dynamic Range Optimization Through Physical Design Tuning Ieee Transactions On Nuclear Science
Clark LT, Patterson DW, Ramamurthy C, et al. (2016) An embedded microprocessor radiation hardened by microarchitecture and circuits Ieee Transactions On Computers. 65: 382-395
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