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J Ruzyllo

Affiliations: 
Pennsylvania State University, State College, PA, United States 
Area:
Electronics and Electrical Engineering
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"J Ruzyllo"
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Paul A. Roman grad student 2000 Penn State
Dong-Oh Lee grad student 2002 Penn State
Chun-Tai Wu grad student 2002 Penn State
Kyuhwan Chang grad student 2005 Penn State
Karthikeyan Shanmugasundaram grad student 2008 Penn State
Patrick J. Drummond grad student 2010 Penn State
Aditya Kshirsagar grad student 2012 Penn State

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Publications

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Sabeeh AH, Brigeman AN, Ruzyllo J. (2019) Performance of Single-Crystal Silicon Solar Cells With Mist-Deposited Nanocrystalline Quantum Dot Downshifting Films Ieee Journal of Photovoltaics. 9: 1006-1011
Sabeeh AH, Price JS, Ruzyllo J. (2017) Effect of lift-off conditions on micropatterning of nanocrystalline quantum dot films Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 35: 61802
Drummond PJ, Wali A, Barth MJ, et al. (2017) Photoconductance Decay Characterization of 3D Multi-Fin Silicon on SOI Substrates Ieee Electron Device Letters. 38: 1513-1515
Ruzyllo J, Drummond PJ. (2016) Electrical Characterization of As-Processed Semiconductor Surfaces - Invited Paper Solid State Phenomena. 255: 299-303
Arora A, Drummond PJ, Ruzyllo J. (2016) Electrical characterization of silicon-on-insulatorwafers using photo-conductance decay (PCD) method Ecs Journal of Solid State Science and Technology. 5: P3069-P3072
Ruzyllo J, Hattori T. (2014) Preface to the Focus Issue on Semiconductor Surface Cleaning and Conditioning Ecs Journal of Solid State Science and Technology. 3: Y1-Y1
Ruzyllo J. (2014) Assessment of the Progress in Gas-Phase Processing of Silicon Surfaces Ecs Journal of Solid State Science and Technology. 3
Ruzyllo J. (2013) The Transistor and Its Many Facets The Electrochemical Society Interface. 22: 39-39
Kshirsagar A, Jiang Z, Pickering S, et al. (2013) Formation of Photo-Luminescent Patterns on Paper Using Nanocrystalline Quantum Dot Ink and Mist Deposition Ecs Journal of Solid State Science and Technology. 2: R87-R90
Drummond PJ, Bhatia D, Ruzyllo J. (2013) Measurement of effective carrier lifetime at the semiconductor–dielectric interface by Photoconductive Decay (PCD) Method Solid-State Electronics. 81: 130-134
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