Federico M. Sciammarella, Ph.D.
Affiliations: | 2003 | Illinois Institute of Technology, Chicago, IL, United States |
Area:
Materials Science Engineering, Metallurgy EngineeringGoogle:
"Federico Sciammarella"Parents
Sign in to add mentor| Philip G. Nash | grad student | 2003 | Illinois Institute of Technology | |
| (Optical technique to measure distortion on heat treated parts.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Sciammarella CA, Lamberti L, Sciammarella FM. (2019) Verification of Continuum Mechanics Predictions with Experimental Mechanics. Materials (Basel, Switzerland). 13 |
| Sciammarella CA, Sciammarella FM, Lamberti L. (2019) Determination of Displacement Fields at the Sub-Nanometric Scale. Materials (Basel, Switzerland). 12 |
| Sciammarella CA, Lamberti L, Sciammarella FM. (2019) The optical signal analysis (OSA) method to process fringe patterns containing displacement information Optics and Lasers in Engineering. 115: 225-237 |
| Sciammarella F. (2018) An optical approach to accurately determine surface finish for additive manufacturing Rapid Prototyping Journal. 24: 313-320 |
| Sciammarella FM, Sciammarella CA, Lamberti L, et al. (2013) Robust mechanical property measurements of fibrous parylene-C thin-film substrate via moiré contouring technology. Journal of the Mechanical Behavior of Biomedical Materials. 20: 237-48 |
| Sciammarella CA, Lamberti L, Sciammarella FM, et al. (2010) Application of Plasmons to the Determination of Surface Profile and Contact Strain Distribution Strain. 46: 307-323 |
| Sciammarella CA, Lamberti L, Pappalettere C, et al. (2006) Measurement of deflections experienced by electronic chips during soldering Journal of Strain Analysis For Engineering Design. 41: 597-608 |
| Sciammarella CA, Sciammarella FM. (2005) Industrial applications of optical techniques that measure displacements Journal of Failure Analysis and Prevention. 5: 61-72 |
| Sciammarella CA, Sciammarella FM. (2003) Measurement of mechanical properties of materials in the micrometer range using electronic holographic moire Optical Engineering. 42: 1215-1222 |
| Sciammarella CA, Sciammarella FM. (2003) Heisenberg principle applied to the analysis of speckle interferometry fringes Optics and Lasers in Engineering. 40: 573-588 |