Valeriu Beiu
Affiliations: | Washington State University, Pullman, WA, United States |
Area:
Electronics and Electrical EngineeringGoogle:
"Valeriu Beiu"
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Publications
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| Dragoi V, Cowell SR, Beiu V, et al. (2018) How Reliable are Compositions of Series and Parallel Networks Compared with Hammocks International Journal of Computers Communications & Control. 13: 772-791 |
| Cowell SR, Beiu V, Daus L, et al. (2018) On the Exact Reliability Enhancements of Small Hammock Networks Ieee Access. 6: 25411-25426 |
| Tache M, Ibrahim W, Kharbash F, et al. (2018) Reliability and performance of optimised Schmitt trigger gates The Journal of Engineering. 2018: 735-744 |
| Beiu V, Dăuş L. (2015) Reliability bounds for two dimensional consecutive systems Nano Communication Networks. 6: 145-152 |
| Ibrahim W, Beiu V, Beg A. (2012) Optimum reliability sizing for complementary metal oxide semiconductor gates Ieee Transactions On Reliability. 61: 675-686 |
| Ibrahim W, Beiu V, Beg A. (2012) GREDA: A fast and more accurate gate reliability EDA tool Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 509-521 |
| Ibrahim W, Beiu V. (2011) Using Bayesian Networks to Accurately Calculate the Reliability of Complementary Metal Oxide Semiconductor Gates Ieee Transactions On Reliability. 60: 538-549 |
| Beiu V, Ibrahim W. (2011) Devices and Input Vectors are Shaping von Neumann Multiplexing Ieee Transactions On Nanotechnology. 10: 606-616 |
| Ibrahim W, Beiu V. (2010) Threshold Voltage Variations Make Full Adders Reliabilities Similar Ieee Transactions On Nanotechnology. 9: 664-667 |
| Ibrahim W, Beiu V, Beg A. (2010) On NOR-2 von Neumann multiplexing Intelligent Decision Technologies. 67-72 |